Effect of water on the electroresponsive structuring and friction in dilute and concentrated ionic liquid lubricant mixtures

The influence of ambient levels of water on the electroresponsive interfacial structuring and nanofriction of ionic liquid lubricant mixtures has been investigated by neutron reflectivity and atomic force microscopy.

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Electroresponsive structuring and friction of a non-halogenated ionic liquid in a polar solvent: effect of concentration

Physical Chemistry Chemical Physics ◽

10.1039/d0cp02736g ◽

2020 ◽

Vol 22 (34) ◽

pp. 19162-19171 ◽

Cited By ~ 1

Author(s):

Georgia A. Pilkington ◽

Anna Oleshkevych ◽

Patricia Pedraz ◽

Seiya Watanabe ◽

Milad Radiom ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Solvent Effect ◽

Polar Solvent ◽

Neutron Reflectivity ◽

Force Microscopy ◽

Frictional Properties ◽

Atomic Force

Neutron reflectivity and atomic force microscopy results reveal the electroresponsive interfacial structuring and nano-frictional properties of ionic liquid (IL) lubricant mixtures with a polar solvent are strongly dependent on bulk IL concentration.

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Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

Applied Physics Letters ◽

10.1063/5.0053848 ◽

2021 ◽

Vol 118 (24) ◽

pp. 243301

Author(s):

Yusuke Morino ◽

Yasuyuki Yokota ◽

Ken-ichi Bando ◽

Hisaya Hara ◽

Akihito Imanishi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Single Crystal ◽

Double Layer ◽

Electric Double Layer ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Interfaces

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Coupling in situ atomic force microscopy (AFM) and ultra-small-angle X-ray scattering (USAXS) to study the evolution of zinc morphology during electrodeposition within an imidazolium based ionic liquid electrolyte

Electrochimica Acta ◽

10.1016/j.electacta.2020.136073 ◽

2020 ◽

Vol 342 ◽

pp. 136073 ◽

Cited By ~ 2

Author(s):

Jayme S. Keist ◽

Joshua A. Hammons ◽

Paul K. Wright ◽

James W. Evans ◽

Christine A. Orme

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Small Angle ◽

Liquid Electrolyte ◽

X Ray ◽

Ionic Liquid Electrolyte ◽

Force Microscopy ◽

X Ray Scattering ◽

Atomic Force

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Structural Analysis of Ionic-liquid/Organic-monolayer Interface by Phase Modulation Atomic Force Microscopy Utilizing a Quartz Tuning Fork Sensor

Electrochemistry ◽

10.5796/electrochemistry.82.380 ◽

2014 ◽

Vol 82 (5) ◽

pp. 380-384 ◽

Cited By ~ 8

Author(s):

Takashi ICHII ◽

Masahiro NEGAMI ◽

Motohiko FUJIMURA ◽

Kuniaki MURASE ◽

Hiroyuki SUGIMURA

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Structural Analysis ◽

Phase Modulation ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Microscopy ◽

Organic Monolayer ◽

Atomic Force

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Atomic-Resolution Imaging on Alkali Halide Surfaces in Viscous Ionic Liquid Using Frequency Modulation Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/jp5078505 ◽

2014 ◽

Vol 118 (46) ◽

pp. 26803-26807 ◽

Cited By ~ 24

Author(s):

Takashi Ichii ◽

Masahiro Negami ◽

Hiroyuki Sugimura

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Frequency Modulation ◽

Alkali Halide ◽

Atomic Resolution ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

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Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy

Physical Chemistry Chemical Physics ◽

10.1039/c4cp06041e ◽

2015 ◽

Vol 17 (10) ◽

pp. 6794-6800 ◽

Cited By ~ 11

Author(s):

Yasuyuki Yokota ◽

Hisaya Hara ◽

Yusuke Morino ◽

Ken-ichi Bando ◽

Akihito Imanishi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Single Crystal ◽

Frequency Modulation ◽

Field Effect ◽

Field Effect Transistors ◽

Force Microscopy ◽

Atomic Force ◽

Clean Interface ◽

Crystal Interfaces

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.

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