Polarization-switching pathway determined electrical transport behaviors in rhombohedral BiFeO3 thin films

Nanoscale ◽  
2021 ◽  
Author(s):  
Jing Wang ◽  
Huayu Yang ◽  
Yue Wang ◽  
Yuanyuan Fan ◽  
Di Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Transport ◽  
Point Contact ◽  
Rhombohedral Phase ◽  
Polarization Switching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bifeo3 Thin Films ◽  
Piezoelectric Force Microscopy

We investigate the polarization-switching pathway dependent electrical transport behaviors in rhombohedral-phase BiFeO3 thin films with a point contact geometry. By combining conducting-atomic force microscopy and piezoelectric force microscopy, we simultaneously...

Highly soluble tetrasubstituted lanthanide bis-phthalocyanines; synthesis, characterization, electrical properties and aggregation studies

2016 ◽  
Vol 20 (08n11) ◽  
pp. 1065-1074 ◽  
Author(s):  
Ahmet T. Bilgiçli ◽  
Armağan Günsel ◽  
Mehmet Kandaz ◽  
Ahmet Altındal ◽  
Hüseyin Cömert
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Electrical Transport ◽  
Hole Mobility ◽  
Electrical Transport Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Coating Method

We report the synthesis, characterization and electrical properties of lanthanide metal based bis-phthalocyanines, {M[Pc-(β-HHT)4]2} (HHT:1-hydroxyhexane-3-ylthio){ M [Formula: see text] Lu[Formula: see text] (2), Eu[Formula: see text] (3), and Yb[Formula: see text] (4)}. The interaction of bis-phthalocyanines with Ag[Formula: see text] and Pd[Formula: see text] metal ions were investigated by UV-vis spectroscopy and atomic force microscopy. Thin films of bis-phthalocyanine molecules were prepared by spin-coating method. The surface morphology of thin films were performed with Atomic Force Microscopy as further investigate. The electrical transport properties of ITO/Pc/Al devices were investigated. At low voltages all the films showed an ohmic conduction, whereas at higher voltage levels the conduction is dominated by space charged limited conduction with exponential distribution of trapping levels. Measurements of current density as a function of inverse temperature at constant applied voltage yielded a hole mobility values, μp[Formula: see text], [Formula: see text] and [Formula: see text] m2.sn[Formula: see text].V[Formula: see text] for lanthanium phthalocyanines. From the analysis of frequency, ω, dependence of electrical conductivity, σac. it was found that the [Formula: see text] obeys the power law given by σac = Aωs, in which the frequency exponent “s” decreases with temperature.

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Nanoscale scratching of platinum thin films using atomic force microscopy with DLC tips

2012 ◽  
Vol 30 (2) ◽  
pp. 021605 ◽  
Author(s):  
Xiaohong Jiang ◽  
Guoyun Wu ◽  
Zuliang Du ◽  
Keng-Jeng Ma ◽  
Jun-ichi Shirakashi ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

1995 ◽  
Vol 382 ◽  
Author(s):  
Martin Pehnt ◽  
Douglas L. Schulz ◽  
Calvin J. Curtis ◽  
Helio R. Moutinho ◽  
Amy Swartzlander ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Cdte Nanoparticles ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Cdte Thin Films

ABSTRACTIn this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

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