Point contact current–voltage measurements on individual organic semiconductor grains by conducting probe atomic force microscopy

2000 ◽  
Vol 18 (2) ◽  
pp. 632 ◽  
Author(s):  
Tommie W. Kelley ◽  
C. Daniel Frisbie
Keyword(s):  
Atomic Force Microscopy ◽  
Organic Semiconductor ◽  
Point Contact ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage

scholarly journals The effect of hydrogen etching on 6H-SiC studied by temperature-dependent current-voltage and atomic force microscopy

2004 ◽  
Vol 85 (9) ◽  
pp. 1547-1549 ◽  
Author(s):  
S. Doğan ◽  
D. Johnstone ◽  
F. Yun ◽  
S. Sabuktagin ◽  
J. Leach ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Temperature Dependent ◽  
Hydrogen Etching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage

Investigations of Local Electrical Characteristics of a Pentacene Thin Film by Point-Contact Current Imaging Atomic Force Microscopy

2012 ◽  
Vol 51 (8S3) ◽  
pp. 08KB05 ◽  
Author(s):  
Tomoharu Kimura ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Point Contact ◽  
Electrical Characteristics ◽  
Force Microscopy ◽  
Atomic Force

Polarization-switching pathway determined electrical transport behaviors in rhombohedral BiFeO3 thin films

Nanoscale ◽  
2021 ◽  
Author(s):  
Jing Wang ◽  
Huayu Yang ◽  
Yue Wang ◽  
Yuanyuan Fan ◽  
Di Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Transport ◽  
Point Contact ◽  
Rhombohedral Phase ◽  
Polarization Switching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bifeo3 Thin Films ◽  
Piezoelectric Force Microscopy

We investigate the polarization-switching pathway dependent electrical transport behaviors in rhombohedral-phase BiFeO3 thin films with a point contact geometry. By combining conducting-atomic force microscopy and piezoelectric force microscopy, we simultaneously...

scholarly journals Refinement of conditions of point-contact current imaging atomic force microscopy for molecular-scale conduction measurements

2007 ◽  
Vol 18 (9) ◽  
pp. 095501 ◽  
Author(s):  
Takashi Yajima ◽  
Hirofumi Tanaka ◽  
Takuya Matsumoto ◽  
Yoichi Otsuka ◽  
Yoshitaka Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Point Contact ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Scale

Atomic Force Microscopy of the Local Electrical Properties of Bilayer Polyaniline-Polystyrene/P(VDF-TrFE) Composite

2021 ◽  
Vol 899 ◽  
pp. 506-511
Author(s):  
Artem V. Budaev ◽  
Ivanna N. Melnikovich ◽  
Vasily E. Melnichenko ◽  
Nikita A. Emelianov
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Polymer Nanocomposite ◽  
Charge Carriers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Piezoelectric Force Microscopy ◽  
Microscopy Techniques

Atomic force microscopy techniques (conductive-AFM, I-V spectroscopy and PFM) were used for characterisation of the local electrical properties of bilayer polyaniline-polystyrene/P(VDF-TrFE) polymer nanocomposite. Observed hysteresis of current-voltage characteristics confirms its memristive properties. It was caused by the influence of the ferroelectric polarization of P(VDF-TrFE) layer, the domain structure of which was visualised by piezoelectric force microscopy on the transport of charge carriers at the interface.

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