Influence of voltage on electrode mass change of AgNi contacts for electromagnetic contactors: relativity of contact resistance and arc mode

2012 ◽  
Author(s):  
K. Yoshida ◽  
K. Sawa
Keyword(s):  
Contact Resistance ◽  
Mass Change ◽  
Electrode Mass

Influence of Voltage on Arc Characteristics and Electrode Mass Change of AgNi Contacts for Electromagnetic Contactors

2011 ◽  
Vol E94-C (9) ◽  
pp. 1395-1401 ◽  
Author(s):  
Kiyoshi YOSHIDA ◽  
Koichiro SAWA ◽  
Kenji SUZUKI ◽  
Masaaki WATANABE
Keyword(s):  
Mass Change ◽  
Arc Characteristics ◽  
Electrode Mass

Microstructural Characterization of Au-Ge-Ni based ohmic contacts to GaAs/AlGaAs modfet device

1987 ◽  
Vol 45 ◽  
pp. 326-327
Author(s):  
A.K. Rai ◽  
A.K. Petford-Long ◽  
A. Ezis ◽  
D.W. Langer
Keyword(s):  
Contact Resistance ◽  
Ohmic Contact ◽  
Ohmic Contacts ◽  
Microstructural Characterization ◽  
Almost Everywhere ◽  
Spacer Layer ◽  
Good Contact ◽  
The Relationship ◽  
Lower Contact

Considerable amount of work has been done in studying the relationship between the contact resistance and the microstructure of the Au-Ge-Ni based ohmic contacts to n-GaAs. It has been found that the lower contact resistivity is due to the presence of Ge rich and Au free regions (good contact area) in contact with GaAs. Thus in order to obtain an ohmic contact with lower contact resistance one should obtain a uniformly alloyed region of good contact areas almost everywhere. This can possibly be accomplished by utilizing various alloying schemes. In this work microstructural characterization, employing TEM techniques, of the sequentially deposited Au-Ge-Ni based ohmic contact to the MODFET device is presented.The substrate used in the present work consists of 1 μm thick buffer layer of GaAs grown on a semi-insulating GaAs substrate followed by a 25 Å spacer layer of undoped AlGaAs.

Glacial Contributions to 21st Century Sea Level Rise

Eos ◽  
2020 ◽  
Vol 101 ◽  
Author(s):  
Kate Wheeling
Keyword(s):  
Sea Level Rise ◽  
Sea Level ◽  
21St Century ◽  
Mass Change ◽  
Sources Of Uncertainty

Researchers identify the main sources of uncertainty in projections of global glacier mass change, which is expected to add about 8–16 centimeters to sea level, through this century.

TEM Studies and Contact Resistance of Au/Ni/Ti/Ta/n-GaN Ohmic Contacts

2003 ◽  
Vol 764 ◽  
Author(s):  
D.N. Zakharov ◽  
Z. Liliental-Weber ◽  
A. Motayed ◽  
S.N. Mohammad
Keyword(s):  
Contact Resistance ◽  
Ohmic Contacts ◽  
High Resolution Electron Microscopy ◽  
X Ray ◽  
Electron Energy Loss Spectrometry ◽  
Resolution Electron ◽  
Order Of Magnitude ◽  
Contact Surfaces ◽  
Electron Energy Loss ◽  
Magnitude Difference

AbstractOhmic Ta/Ti/Ni/Au contacts to n-GaN have been studied using high resolution electron microscopy (HREM), energy dispersive X-ray spectrometry (EDX) and electron energy loss spectrometry (EELS). Two different samples were used: A - annealed at 7500C withcontact resistance 5×10-6 Ω cm2 and B-annealed at 7750C with contact resistance 6×10-5 Ω cm2. Both samples revealed extensive in- and out-diffusion between deposited layers with some consumption ofGaNlayerand formation of TixTa1-xN50 (0<x<25) at the GaN interface. Almost an order of magnitude difference in contact resistances can be attributed to structure and chemical bonding of Ti-O layers formed on the contact surfaces.

Influence of Arc Discharge on Contact Resistance of AgNi Contacts for Electromagnetic Contactors

2012 ◽  
Vol E95.C (9) ◽  
pp. 1531-1534 ◽  
Author(s):  
Kiyoshi YOSHIDA ◽  
Koichiro SAWA ◽  
Kenji SUZUKI ◽  
Masaaki WATANABE
Keyword(s):  
Contact Resistance ◽  
Arc Discharge

Experimental Investigation and Numerical Simulation on the Role of Sphere Indenter in Measuring Contact Resistance of Flat Rivets

2014 ◽  
Vol E97.C (9) ◽  
pp. 873-879 ◽  
Author(s):  
Wanbin REN ◽  
Yu CHEN ◽  
Shengjun XUE ◽  
Guenther HORN ◽  
Guofu ZHAI
Keyword(s):  
Numerical Simulation ◽  
Experimental Investigation ◽  
Contact Resistance
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