Smart TDI readout circuit for long-wavelength IR detector

2002 ◽  
Vol 38 (16) ◽  
pp. 854 ◽  
Author(s):  
Byunghyuk Kim ◽  
Hee Chul Lee
Author(s):  
Zhiwei Huang ◽  
Xing Xu ◽  
Wuying Li ◽  
Yanping Zhong ◽  
Honghui Yuan ◽  
...  

Author(s):  
Honghui Yuan ◽  
YongPing Chen ◽  
Zhiwei Huang ◽  
Xing Xu ◽  
Wuying Li ◽  
...  

2000 ◽  
Vol 10 (01) ◽  
pp. 47-53
Author(s):  
G. J. BROWN ◽  
F. SZMULOWICZ ◽  
K. MAHALINGAM ◽  
A. SAXLER ◽  
R. LINVILLE ◽  
...  

New infrared (IR) detector materials with high sensitivity, multi-spectral capability, improved uniformity and lower manufacturing costs are required for numerous space-based infrared imaging applications. To meet these stringent requirements, new materials must be designed and grown using semiconductor heterostructures, such as quantum wells and superlattices, to tailor new optical and electrical properties unavailable in the current generation of materials. One of the most promising materials is a strained layer supperlattice (SLS) composed of thin InAs and GaInSb layers. While this material shows theoretical and early experimental promise, there are still several materials growth and processing issues to be addressed before this material can be transitioned to the next generation of infrared detector arrays. Our research is focused on addressing the basic materials design, growth, optical properties, and electronic transport issue of these superlattices.


2021 ◽  
Vol 50 (2) ◽  
pp. 20200266-20200266
Author(s):  
张武康 Wukang Zhang ◽  
陈洪雷 Honglei Chen ◽  
丁瑞军 Ruijun Ding

2015 ◽  
Vol 64 (11) ◽  
pp. 118503
Author(s):  
Yuan Hong-Hui ◽  
Chen Yong-Ping
Keyword(s):  

1997 ◽  
Vol 484 ◽  
Author(s):  
P. Mitra ◽  
F. C. Case ◽  
S. L. Barnes ◽  
M. B. Reine ◽  
P. O'Dette ◽  
...  

AbstractRecent results on MOVPE growth of multilayer two-color HgCdTe detectors, for simultaneous and independent detection of medium wavelength (MW, 3–5 μm) and long wavelength (LW, 8–12 μm) bands, are reported. The structures are grown in situ on lattice matched (100) CdZnTe in the double-heterojunction p-n-N-P configuration. A barrier layer is placed between the LW and MW absorber layers to prevent diffusion of MW photocarriers into the LW junction and thereby eliminate spectral crosstalk. X-ray double crystal rocking curve widths are ∼ 45 arc-secs, indicating good epitaxial quality. SIMS depth profile measurements of these 28 μm thick structures show well-defined alloy compositions, and arsenic and iodine doping. SIMS data on a series of thirteen films show that good run-to-run repeatability is obtained on thicknesses, compositions, and dopant levels with values close to the device design targets. Depth profile of etch pits through the thickness of the films show etch pit densities in the range of 8×105-5×106 cm−2.


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