Logistic model for leakage current in electrical stressed ultra-thin gate oxides

2003 ◽  
Vol 39 (9) ◽  
pp. 749 ◽  
Author(s):  
E. Miranda ◽  
A. Cester ◽  
A. Paccagnella
Keyword(s):  
Leakage Current ◽  
Logistic Model ◽  
Gate Oxides

Effects of nitridation by nitric oxide on the leakage current of thin SiO2 gate oxides

2000 ◽  
Vol 87 (1) ◽  
pp. 498-501 ◽  
Author(s):  
C. Gerardi ◽  
M. Melanotte ◽  
S. Lombardo ◽  
M. Alessandri ◽  
B. Crivelli ◽  
...  
Keyword(s):  
Nitric Oxide ◽  
Leakage Current ◽  
Gate Oxides

Stress induced leakage current in ultra-thin gate oxides after constant current stress

1997 ◽  
Vol 36 (1-4) ◽  
pp. 145-148 ◽  
Author(s):  
A. Scarpa ◽  
G. Ghibaudo ◽  
G. Ghidini ◽  
G. Pananakakis ◽  
A. Paccagnella
Keyword(s):  
Leakage Current ◽  
Constant Current ◽  
Gate Oxides ◽  
Current Stress ◽  
Stress Induced Leakage Current

A model of the stress induced leakage current in gate oxides

2001 ◽  
Vol 48 (2) ◽  
pp. 285-288 ◽  
Author(s):  
L. Larcher ◽  
A. Paccagnella ◽  
G. Ghidini
Keyword(s):  
Leakage Current ◽  
Gate Oxides ◽  
Stress Induced Leakage Current

A model of radiation induced leakage current (RILC) in ultra-thin gate oxides

1999 ◽  
Vol 46 (6) ◽  
pp. 1553-1561 ◽  
Author(s):  
L. Larcher ◽  
A. Paccagnella ◽  
M. Ceschia ◽  
G. Ghidini
Keyword(s):  
Leakage Current ◽  
Gate Oxides ◽  
Radiation Induced

Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electron or X-ray irradiation

2000 ◽  
Vol 47 (3) ◽  
pp. 566-573 ◽  
Author(s):  
M. Ceschia ◽  
A. Paccagnella ◽  
S. Sandrin ◽  
G. Ghidini ◽  
J. Wyss ◽  
...  
Keyword(s):  
Leakage Current ◽  
Heavy Ions ◽  
Gate Oxides ◽  
X Ray ◽  
Low Field ◽  
Soft Breakdown
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