An investigation on the leakage current and time dependent dielectric breakdown of ferroelectric lead–zirconate–titanate thin film capacitors for memory device applications

Thin Film Capacitors ◽

Device Applications ◽

Erratum: “An investigation on the leakage current and time dependent dielectric breakdown of ferroelectric lead–zirconate–titanate thin film capacitors for memory device applications” [Appl. Phys. Lett. 69, 4011 (1996)]

Applied Physics Letters ◽

10.1063/1.119268 ◽

1997 ◽

Vol 70 (8) ◽

pp. 1058-1058

Author(s):

Jia-lin Chen ◽

Hong-ming Chen ◽

Joseph Ya-min Lee

Keyword(s):

Thin Film ◽

Lead Zirconate Titanate ◽

Dielectric Breakdown ◽

Memory Device ◽

Lead Zirconate ◽

Time Dependent ◽

Thin Film Capacitors ◽

Device Applications ◽

Time dependent dielectric breakdown of paraelectric barium-strontium-titanate thin film capacitors for memory device applications

Journal of Applied Physics ◽

10.1063/1.368765 ◽

1998 ◽

Vol 84 (9) ◽

pp. 5155-5157 ◽

Cited By ~ 18

Author(s):

Shu-chun Huang ◽

Hong-ming Chen ◽

Shich Chuan Wu ◽

Joseph Ya-min Lee

Keyword(s):

Thin Film ◽

Barium Strontium Titanate ◽

Dielectric Breakdown ◽

Memory Device ◽

Time Dependent ◽

Barium Strontium ◽

Thin Film Capacitors ◽

Device Applications ◽

Leakage Current Characteristics of Lead-Zirconate-Titanate Thin Film Capacitors for Memory Device Applications

Japanese Journal of Applied Physics ◽

10.1143/jjap.37.4056 ◽

1998 ◽

Vol 37 (Part 1, No. 7A) ◽

pp. 4056-4060 ◽

Cited By ~ 31

Author(s):

Hong-ming Chen ◽

Sheng-wei Tsaur ◽

Joseph Ya-min Lee

Keyword(s):

Thin Film ◽

Leakage Current ◽

Lead Zirconate Titanate ◽

Memory Device ◽

Lead Zirconate ◽

Zirconate Titanate ◽

Thin Film Capacitors ◽

Device Applications ◽

Current Characteristics ◽

Effects of Thermal Annealing on Lead Zirconate Titanate Thin Film Capacitors with Platinum Electrodes

Journal of The Electrochemical Society ◽

10.1149/1.2779954 ◽

2007 ◽

Vol 154 (11) ◽

pp. G251 ◽

Cited By ~ 3

Author(s):

Jiang-Li Cao ◽

Axel Solbach ◽

Yan Fang ◽

Ulrich Boettger ◽

Peter J. Schorn ◽

...

Keyword(s):

Thin Film ◽

Thermal Annealing ◽

Lead Zirconate Titanate ◽

Lead Zirconate ◽

Platinum Electrodes ◽

Zirconate Titanate ◽

Thin Film Capacitors ◽

Lead zirconate titanate thin film capacitors on electroless nickel coated copper foils for embedded passive applications

Thin Solid Films ◽

10.1016/j.tsf.2007.02.085 ◽

2007 ◽

Vol 515 (18) ◽

pp. 7331-7336 ◽

Cited By ~ 13

Author(s):

Taeyun Kim ◽

Angus I. Kingon ◽

Jon-Paul Maria ◽

Robert T. Croswell

Keyword(s):

Thin Film ◽

Lead Zirconate Titanate ◽

Electroless Nickel ◽

Lead Zirconate ◽

Copper Foils ◽

Zirconate Titanate ◽

Thin Film Capacitors ◽

Thickness Dependence of the Time Dependent Dielectric Breakdown Characteristics of Pb(Zr, Ti)O3Thin Film Capacitors for Memory Device Applications

Japanese Journal of Applied Physics ◽

10.1143/jjap.39.3488 ◽

2000 ◽

Vol 39 (Part 1, No. 6A) ◽

pp. 3488-3491 ◽

Cited By ~ 5

Author(s):

T. K. Kundu ◽

Joseph Ya-min Lee

Keyword(s):

Dielectric Breakdown ◽

Memory Device ◽

Thickness Dependence ◽

Time Dependent ◽

Device Applications

Impact of time dependent dielectric breakdown and stress-induced leakage current on the reliability of high dielectric constant (Ba,Sr)TiO/sub 3/ thin-film capacitors for Gbit-scale DRAMs

IEEE Transactions on Electron Devices ◽

10.1109/16.740900 ◽

1999 ◽

Vol 46 (2) ◽

pp. 342-347 ◽

Cited By ~ 24

Author(s):

S. Yamamichi ◽

A. Yamamichi ◽

Donggun Park ◽

Tsu-Jae King ◽

Chenming Hu

Keyword(s):

Thin Film ◽

Dielectric Constant ◽

Leakage Current ◽

High Dielectric Constant ◽

Dielectric Breakdown ◽

Time Dependent ◽

Thin Film Capacitors ◽

Stress Induced Leakage Current ◽

High Dielectric

Cavity origin and influence on reliability in lead zirconate titanate thin film capacitors

Journal of Applied Physics ◽

10.1063/1.3212985 ◽

2009 ◽

Vol 106 (5) ◽

pp. 054108 ◽

Cited By ~ 4

Author(s):

Mohamed-Tahar Chentir ◽

Laurent Ventura ◽

Émilien Bouyssou ◽

Christine Anceau

Keyword(s):

Thin Film ◽

Lead Zirconate Titanate ◽

Lead Zirconate ◽

Zirconate Titanate ◽

Thin Film Capacitors ◽

Reducing Film Thickness in Lead Zirconate Titanate Thin Film Capacitors

10.21236/ada474969 ◽

2007 ◽

Author(s):

Vikram Rao ◽

Ronald G. Polcawich

Keyword(s):

Thin Film ◽

Film Thickness ◽

Lead Zirconate Titanate ◽

Lead Zirconate ◽

Zirconate Titanate ◽

Thin Film Capacitors ◽

Schottky barrier effects in the electronic conduction of sol–gel derived lead zirconate titanate thin film capacitors

Journal of Applied Physics ◽

10.1063/1.368747 ◽

1998 ◽

Vol 84 (9) ◽

pp. 5005-5011 ◽

Cited By ~ 48

Author(s):

Y. S. Yang ◽

S. J. Lee ◽

S. H. Kim ◽

B. G. Chae ◽

M. S. Jang

Keyword(s):

Thin Film ◽

Schottky Barrier ◽

Lead Zirconate Titanate ◽

Sol Gel ◽

Lead Zirconate ◽

Electronic Conduction ◽

Barrier Effects ◽

Zirconate Titanate ◽

Thin Film Capacitors ◽