Dependence of polycrystalline silicon thin-film transistor characteristics on the grain-boundary location

2001 ◽  
Vol 89 (1) ◽  
pp. 596-600 ◽  
Author(s):  
Mutsumi Kimura ◽  
Satoshi Inoue ◽  
Tatsuya Shimoda ◽  
Tsukasa Eguchi
Keyword(s):  
Thin Film ◽  
Grain Boundary ◽  
Polycrystalline Silicon ◽  
Thin Film Transistor ◽  
Silicon Thin Film ◽  
Boundary Location

A Center-Offset Polycrystalline-Silicon Thin-Film Transistor With ${\rm n}^{+}$ Amorphous-Silicon Contacts

2009 ◽  
Vol 30 (1) ◽  
pp. 36-38 ◽  
Author(s):  
J. H. Oh ◽  
D. H. Kang ◽  
W. H. Park ◽  
J. Jang ◽  
Y. J. Chang ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Polycrystalline Silicon ◽  
Thin Film Transistor ◽  
Silicon Thin Film
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