Two-dimensional energy dispersive x-ray diffraction at high pressures and temperatures

2001 ◽  
Vol 72 (2) ◽  
pp. 1302 ◽  
Author(s):  
Yanzhang Ma ◽  
Ho-kwang Mao ◽  
Russell J. Hemley ◽  
Stephen A. Gramsch ◽  
Guoyin Shen ◽  
...  
Keyword(s):  
High Pressures ◽  
Energy Dispersive ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Pressures And Temperatures

Transformation from molecular to polymeric nitrogen at high pressures and temperatures: In situ x-ray diffraction study

2008 ◽  
Vol 93 (9) ◽  
pp. 091907 ◽  
Author(s):  
I. A. Trojan ◽  
M. I. Eremets ◽  
S. A. Medvedev ◽  
A. G. Gavriliuk ◽  
V. B. Prakapenka
Keyword(s):  
Diffraction Study ◽  
High Pressures ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Pressures And Temperatures ◽  
Polymeric Nitrogen

Synthesis of carbon nitride crystals at high pressures and temperatures

1998 ◽  
Vol 13 (12) ◽  
pp. 3458-3462 ◽  
Author(s):  
D. W. He ◽  
F. X. Zhang ◽  
X. Y. Zhang ◽  
Z. C. Qin ◽  
M. Zhang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Carbon Nitride ◽  
High Pressures ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Nickel Based Alloy ◽  
High Pressures And Temperatures ◽  
Scanning Electron

Carbon nitride crystals have been synthesized from C3N4H4 in the presence of a nickel-based alloy or cobalt as a catalyst at high pressure of 7 GPa and temperature of about 1400 °C. Scanning electron microscopy showed rod-like, well-faceted crystals with size of several micrometers, and the N content in these carbon nitride crystals was 47–62%. X-ray diffraction indicated the crystals were composed of α–C3N4 and β–C3N4. The experimental lattice constants of α–C3N4 (a = 6.425 Å, c = 4.715 Å ) and β–C3N4 (a = 6.419 Å, c = 2.425 Å ) agree with ab initio calculations very well.

scholarly journals Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector

2017 ◽  
Vol 50 (3) ◽  
pp. 901-908 ◽  
Author(s):  
A. Abboud ◽  
C. Kirchlechner ◽  
J. Keckes ◽  
T. Conka Nurdan ◽  
S. Send ◽  
...  
Keyword(s):  
Elastic Strain ◽  
Strain Tensor ◽  
Energy Dispersive ◽  
Single Shot ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Laue Diffraction ◽  
Experimental Procedure ◽  
X Ray ◽  
Diffraction Patterns

The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation with an energy range from 5 to 23 keV. Microbeam X-ray Laue diffraction patterns were collected from a copper micro-bending beam along the central axis (centroid of the cross section). Taking advantage of a two-dimensional energy-dispersive X-ray detector (pnCCD), the position and energy of the collected Laue spots were measured for multiple positions on the sample, allowing the measurement of variations in the local microstructure. At the same time, both the deviatoric and hydrostatic components of the elastic strain and stress tensors were calculated.

scholarly journals Water Structure under High Pressures and High Temperatures Studied by Energy-Dispersive X-Ray Diffraction and EPSR Modeling

2013 ◽  
Vol 23 (4) ◽  
pp. 309-318
Author(s):  
Koji YOSHIDA ◽  
Koji FUJIMURA ◽  
Kazuya UCHI ◽  
Yoshinori KATAYAMA ◽  
Toshio YAMAGUCHI
Keyword(s):  
High Temperatures ◽  
High Pressures ◽  
Water Structure ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Structures of Aqueous Calcium Chloride Solutions by Energy-dispersive X-ray Diffraction under High Temperatures and High Pressures

2015 ◽  
Vol 64 (3) ◽  
pp. 203-210 ◽  
Author(s):  
Toshiyuki TAKAMUKU ◽  
Oscar F. YAGAFAROV ◽  
Yoshinori KATAYAMA ◽  
Tatsuya UMECKY
Keyword(s):  
Calcium Chloride ◽  
High Temperatures ◽  
High Pressures ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
Chloride Solutions ◽  
X Ray
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