Correlation between nucleation layer structure, dislocation density, and electrical resistivity for GaN films grown on a-plane sapphire by metalorganic vapor phase epitaxy
1994 ◽
Vol 145
(1-4)
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pp. 622-629
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1999 ◽
Vol 38
(Part 2, No. 10B)
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pp. L1159-L1162
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2012 ◽
Vol 51
(4S)
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pp. 04DH02
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Keyword(s):
2012 ◽
Vol 51
◽
pp. 04DH02
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Keyword(s):
2005 ◽
Vol 282
(1-2)
◽
pp. 36-44
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Keyword(s):