scholarly journals Calibration method of curvature distortion in step height measurement by atomic force microscopy

2020 ◽  
Vol 715 ◽  
pp. 012056
Author(s):  
Wei Li ◽  
Xixi Yu ◽  
Sitian Gao ◽  
Yushu Shi ◽  
Shi Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Calibration Method ◽  
Step Height ◽  
Height Measurement ◽  
Force Microscopy ◽  
Atomic Force

Determination of Corner Positions for Calculation of Step Height of Atomic Force Microscope Images Based on ISO 5436-1

2013 ◽  
Vol 19 (3) ◽  
pp. 769-774 ◽  
Author(s):  
Adedayo S. Adebayo ◽  
Zhao Xuezeng ◽  
Wang Weijie
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscope ◽  
Step Height ◽  
Height Measurement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscope Images ◽  
Image Metrology ◽  
Vertical Spacing

AbstractStep height is defined as the vertical spacing between two plane-parallel planes comprising an elevation or an indentation and the substrate. In atomic force microscopy (AFM), there are many algorithms for determining feature dimensions such as step height and width. One common problem of many algorithms is the difficulty for users to accurately determine the corner positions needed to properly implement the said algorithms. A new algorithm based on ISO 5436-1 is proposed that determines the necessary corner positions along with two examples illustrating the implementation of this algorithm. We propose calling this new method the determinant method. Since the corner positions are automatically decided, feature dimensions such as step height of an AFM image are easily determined. Comparative experiments carried out to compare the step height measurement using this algorithm and the SPIP software from Image Metrology show encouraging results.

Measurement of Frictional Forces in Atomic Force Microscopy

2007 ◽  
Vol 121-123 ◽  
pp. 851-854 ◽  
Author(s):  
D.H. Choi ◽  
W. Hwang
Keyword(s):  
Atomic Force Microscopy ◽  
Conversion Factor ◽  
Calibration Method ◽  
Adhesive Force ◽  
Torsional Angle ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Moment ◽  
Frictional Forces ◽  
The Relationship

A new calibration method of frictional forces in atomic force microscopy (AFM) is suggested. An angle conversion factor is defined using the relationship between torsional angle and frictional signal. When the factor is measured, the slopes of the torsional angle and the frictional signal as a function of the normal force are used to eliminate the effect of the adhesive force. Moment balance equations on the flat surface and the top edge of a commercial step grating are used to obtain the angle conversion factor. After the factor is obtained from an AFM system, it can be applied to all cantilevers without additional experiments.

Study of surface structure and dextran incorporation into sucrose crystals using atomic force microscopy

2012 ◽  
pp. 227-229 ◽  
Author(s):  
Issam Khaddour ◽  
Fernando Rocha ◽  
Luis Bento
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Surface Structure ◽  
Critical Nucleus ◽  
Crystal Surface ◽  
Step Height ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sucrose Crystals ◽  
Mechanism Of Growth

Atomic force microscopy (AFM) represents a useful tool in providing information on the mechanism of growth of sucrose and the molecular roughness of the crystal surface with changes in the supersaturation level. Moreover, a better understanding of the effect of dextran as a macromolecular nonsugar on sucrose crystal growth is obtained. Step height, and the radius of the 2D critical nucleus were determined using the AFM technique.

Sign in / Sign up

Export Citation Format

Share Document