Diffuse x-ray scattering and transmission electron microscopy study of defects in antimony-implanted silicon

Microscopy Study ◽

X Ray ◽

X Ray Scattering ◽

Transmission Electron ◽

Ray Scattering

Small angle X-ray scattering and transmission electron microscopy study of theLactobacillus brevisS-layer protein

Journal of Physics Conference Series ◽

10.1088/1742-6596/247/1/012017 ◽

2010 ◽

Vol 247 ◽

pp. 012017 ◽

Cited By ~ 1

Author(s):

Pentti Jääskeläinen ◽

Peter Engelhardt ◽

Ulla Hynönen ◽

Mika Torkkeli ◽

Airi Palva ◽

...

Keyword(s):

Electron Microscopy ◽

Small Angle ◽

Microscopy Study ◽

X Ray ◽

X Ray Scattering ◽

Transmission Electron ◽

Ray Scattering

Synthesis of NiGa Layered Double Hydroxides. A Combined Extended X-ray Absorption Fine Structure, Small-Angle X-ray Scattering, and Transmission Electron Microscopy Study. 1. Hydrolysis in the Pure Ni2+System

Langmuir ◽

10.1021/la035279m ◽

2003 ◽

Vol 19 (25) ◽

pp. 10588-10600 ◽

Cited By ~ 10

Author(s):

Guillaume Defontaine ◽

Laurent J. Michot ◽

Isabelle Bihannic ◽

Jaafar Ghanbaja ◽

Valérie Briois

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

X Ray ◽

X Ray Scattering ◽

Transmission Electron ◽

Double Hydroxides ◽

X Ray Absorption

Dopant deactivation in heavily Sb doped Si (001): A high-resolution x-ray diffraction and transmission electron microscopy study

Journal of Applied Physics ◽

10.1063/1.1510953 ◽

2002 ◽

Vol 92 (9) ◽

pp. 5503-5507 ◽

Cited By ~ 22

Author(s):

Yayoi Takamura ◽

Arturas Vailionis ◽

Ann F. Marshall ◽

Peter B. Griffin ◽

James D. Plummer

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron ◽

Dopant Deactivation

Base Metal Catalyzed Graphitization of Cellulose: A Combined Raman Spectroscopy, Temperature-Dependent X-ray Diffraction and High-Resolution Transmission Electron Microscopy Study

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.5b00477 ◽

2015 ◽

Vol 119 (19) ◽

pp. 10653-10661 ◽

Cited By ~ 67

Author(s):

Jacco Hoekstra ◽

Andrew M. Beale ◽

Fouad Soulimani ◽

Marjan Versluijs-Helder ◽

John W. Geus ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

X Ray Diffraction ◽

Temperature Dependent ◽

X Ray ◽

Transmission Electron ◽

Metal Catalyzed

Interfacial reaction pathways and kinetics during annealing of 111-textured Al/TiN bilayers: A synchrotron x-ray diffraction and transmission electron microscopy study

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1379800 ◽

2001 ◽

Vol 19 (5) ◽

pp. 2207-2216 ◽

Cited By ~ 11

Author(s):

J.-S. Chun ◽

P. Desjardins ◽

C. Lavoie ◽

I. Petrov ◽

C. Cabral ◽

...

Keyword(s):

Electron Microscopy ◽

Interfacial Reaction ◽

Microscopy Study ◽

Reaction Pathways ◽

X Ray Diffraction ◽

X Ray ◽

X-ray diffraction and transmission electron microscopy study of recovery and recrystallization in niobium and niobium--40 vanadium

10.2172/4653374 ◽

1972 ◽

Author(s):

Paul Vincent Guthrie, Jr.

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

X Ray Diffraction ◽

X Ray ◽

Reactive magnetron sputtering of molybdenum sulfide thin films:In situsynchrotron x-ray diffraction and transmission electron microscopy study

Journal of Applied Physics ◽

10.1063/1.1736323 ◽

2004 ◽

Vol 95 (12) ◽

pp. 7665-7673 ◽

Cited By ~ 14

Author(s):

V. Weiss ◽

W. Bohne ◽

J. Röhrich ◽

E. Strub ◽

U. Bloeck ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

Molybdenum Sulfide ◽

Reactive Magnetron ◽

X Ray Diffraction ◽

X Ray ◽

High-energy x-ray and transmission electron microscopy study of structural transformations in Ti-V

Physical Review B ◽

10.1103/physrevb.73.024204 ◽

2006 ◽

Vol 73 (2) ◽

Cited By ~ 6

Author(s):

I. B. Ramsteiner ◽

A. Schöps ◽

F. Phillipp ◽

M. Kelsch ◽

H. Reichert ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

High Energy ◽

Structural Transformations ◽

X Ray ◽

X-ray photoelectron spectroscopy and transmission electron microscopy study of internally oxidized Nb–Ru coatings

Thin Solid Films ◽

10.1016/j.tsf.2013.02.066 ◽

2013 ◽

Vol 544 ◽

pp. 491-495 ◽

Cited By ~ 8

Author(s):

Yung-I Chen ◽

Sin-Min Chen ◽

Li-Chun Chang ◽

Hsiu-Nuan Chu

Keyword(s):

Electron Microscopy ◽

Photoelectron Spectroscopy ◽

Microscopy Study ◽

X Ray ◽

An X-ray diffraction and transmission electron microscopy study of Pt–Ru fuel cell catalysts before and after operation

Journal of Applied Electrochemistry ◽

10.1023/b:jach.0000015674.49162.3f ◽

2004 ◽

Vol 34 (3) ◽

pp. 345-348 ◽

Cited By ~ 10

Author(s):

C. Roth ◽

N. Martz ◽

H. Fuess

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron ◽

Fuel Cell Catalysts ◽

Before And After