High-temperature modeling and characterization of 6H silicon carbide metal-oxide-semiconductor field-effect transistors
Keyword(s):
2015 ◽
Vol 32
(12)
◽
pp. 127101
◽
2004 ◽
Vol 22
(1)
◽
pp. 327
◽
Keyword(s):
2006 ◽
pp. 1011-1014
Keyword(s):
2001 ◽
Vol 188
(1)
◽
pp. 219-222
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2007 ◽
Vol 46
(4B)
◽
pp. 1921-1928
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