Quantitative structural characterization of GaN quantum dot ripening using reflection high-energy electron diffraction

2007 ◽  
Vol 101 (5) ◽  
pp. 056106 ◽  
Author(s):  
J. Coraux ◽  
V. Favre-Nicolin ◽  
H. Renevier ◽  
M. G. Proietti ◽  
B. Amstatt ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Quantum Dot ◽  
Structural Characterization ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron

scholarly journals In situ characterization of GaN quantum dot growth with reflection high-energy electron diffraction and line-of-sight mass spectrometry

2006 ◽  
Vol 99 (12) ◽  
pp. 124909 ◽  
Author(s):  
Jay S. Brown ◽  
Gregor Koblmüller ◽  
Robert Averbeck ◽  
Henning Riechert ◽  
James S. Speck
Keyword(s):  
Mass Spectrometry ◽  
Electron Diffraction ◽  
Quantum Dot ◽  
High Energy ◽  
Energy Electron ◽  
Line Of Sight ◽  
High Energy Electron ◽  
In Situ Characterization

Characterization of Ultrathin Fe–Co Layer Grown on Amorphous Co–Fe–B by In situ Reflective High-Energy Electron Diffraction

2013 ◽  
Vol 6 (6) ◽  
pp. 063003 ◽  
Author(s):  
Hiroyuki Hosoya ◽  
Yoshinori Nagamine ◽  
Koji Tsunekawa ◽  
Vadym Zayets ◽  
Shinji Yuasa
Keyword(s):  
Electron Diffraction ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron
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