Characterization of metamorphic InxAl1−xAs∕GaAs buffer layers using reciprocal space mapping

2007 ◽  
Vol 101 (6) ◽  
pp. 063523 ◽  
Author(s):  
D. Lee ◽  
M. S. Park ◽  
Z. Tang ◽  
H. Luo ◽  
R. Beresford ◽  
...  
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Buffer Layers ◽  
Reciprocal Space Mapping

Strain characterization of Ge 1−x Si x and heavily B-doped Ge layers on Ge(001) by two-dimensional reciprocal space mapping

1996 ◽  
Vol 167 (3-4) ◽  
pp. 495-501 ◽  
Author(s):  
H.H. Radamson ◽  
K.B. Joelsson ◽  
W.-X. Ni ◽  
J. Birch ◽  
J.-E. Sundgren ◽  
...  
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Two Dimensional ◽  
Reciprocal Space Mapping ◽  
Strain Characterization

Asymmetrical reciprocal space mapping using X-ray diffraction: a technique for structural characterization of GaN/AlN superlattices

CrystEngComm ◽  
2017 ◽  
Vol 19 (22) ◽  
pp. 2977-2982 ◽  
Author(s):  
H. V. Stanchu ◽  
A. V. Kuchuk ◽  
M. Barchuk ◽  
Yu. I. Mazur ◽  
V. P. Kladko ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Space Mapping ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Reciprocal Space Mapping ◽  
X Ray

Structural Characterization of BiFeO3Thin Films by Reciprocal Space Mapping

2006 ◽  
Vol 45 (9B) ◽  
pp. 7311-7314 ◽  
Author(s):  
Keisuke Saito ◽  
Alexander Ulyanenkov ◽  
Volkmar Grossmann ◽  
Heiko Ress ◽  
Lutz Bruegemann ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping

In Situ X-Ray Reciprocal Space Mapping for Characterization of Nanomaterials

2016 ◽  
pp. 507-544 ◽  
Author(s):  
Peter Siffalovic ◽  
Karol Vegso ◽  
Martin Hodas ◽  
Matej Jergel ◽  
Yuriy Halahovets ◽  
...  
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping ◽  
X Ray

Characterization of Nanoscale Domain Structures in Epitaxial Ferroelectric PbTiO3 Capacitors by Reciprocal Space Mapping

2007 ◽  
Author(s):  
Kilho Lee ◽  
Hee Han ◽  
Hyunjung Yi ◽  
Yong Jun Park ◽  
Jae-Young Choi ◽  
...  
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping ◽  
Domain Structures

X-ray characterization of epi-Ge/Pr2 O3 /Si(111) layer stacks by pole figures and reciprocal space mapping

2009 ◽  
Vol 206 (8) ◽  
pp. 1809-1815 ◽  
Author(s):  
Peter Zaumseil ◽  
Alessandro Giussani ◽  
Peter Rodenbach ◽  
Thomas Schroeder
Keyword(s):  
Space Mapping ◽  
Reciprocal Space ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Pole Figures
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