Characterization of structure and morphology of an advanced p-channel field effect transistor under uniaxial stress by synchrotron x-ray diffraction

2007 ◽  
Vol 90 (17) ◽  
pp. 172117 ◽  
Author(s):  
A. Parikh ◽  
W. Yarbrough ◽  
M. Mason ◽  
S. Sridhar ◽  
P. R. Chidambaram ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistor ◽  
Uniaxial Stress ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure And Morphology ◽  
Effect Transistor

Low-glancing-angle x-ray diffraction study on the relationship between crystallinity and properties of C60 field effect transistor

2004 ◽  
Vol 84 (4) ◽  
pp. 520-522 ◽  
Author(s):  
Hirotaka Ohashi ◽  
Katsumi Tanigaki ◽  
Ryotaro Kumashiro ◽  
Syuji Sugihara ◽  
Shinya Hiroshiba ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Field Effect ◽  
Field Effect Transistor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glancing Angle ◽  
Effect Transistor ◽  
The Relationship

Synthesis and Characterization of Multiferroic NiFe2O4/BiFeO3 Nanocomposites by Modified Pechini Method

2011 ◽  
Vol 197-198 ◽  
pp. 456-459
Author(s):  
Xian Ming Liu ◽  
Wen Liang Gao
Keyword(s):  
Pechini Method ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
Magnetic Bias ◽  
Field Frequency ◽  
Magnetic Field Frequency ◽  
X Ray ◽  
Structure And Morphology ◽  
Modified Pechini Method

Spinel-perovskite multiferroics of NiFe2O4/BiFeO3 nanoparticles were prepared by modified Pechini method. The structure and morphology of the composites were examined by means of X-ray diffraction (XRD) and scanning electron microscopy (SEM). The results showed that the composites consisted of spinel NiFe2O4 and perovskite BiFeO3 after annealed at 700°C for 2h, and the particle size ranges from 40 to 100nm. VSM and ME results indicated that the nanocomposites exhibited both tuning magnetic properties and a ME effect. The ME effect of the nanocomposites strongly depended on the magnetic bias and magnetic field frequency.

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