Quantitative Determination of Deuterium Atom Concentration in Zinc Oxide Thin Films by Time-of-Flight Secondary Ion Mass Spectrometry

2009 ◽  
Author(s):  
Zihua Zhu ◽  
Vaithiyalingam Shutthanandan ◽  
Yuanjie Li ◽  
Scott A. Chambers ◽  
Floyd D. McDaniel ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
Zinc Oxide ◽  
Quantitative Determination ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Deuterium Atom ◽  
Atom Concentration ◽  
Secondary Ion

A quantitative determination of the polymerization of benzoxazine thin coatings by time‐of‐flight secondary ion mass spectrometry

2019 ◽  
Vol 51 (6) ◽  
pp. 674-680 ◽  
Author(s):  
Eva Pospisilova ◽  
Alexis Renaud ◽  
Marc Poorteman ◽  
Marjorie Olivier ◽  
Ludovic Dumas ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Quantitative Determination ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Thin Coatings ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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