Anomalous effects on the current‐voltage characteristics ofp‐channel metal‐oxide‐semiconductor transistors in the temperature range 4.2–50 K
1995 ◽
Vol 34
(Part 2, No. 8A)
◽
pp. L978-L980
2006 ◽
Vol 51
(2)
◽
pp. 123-140
◽
2016 ◽
Vol 55
(5)
◽
pp. 054103
◽
1995 ◽
Vol 187
◽
pp. 175-180
◽
1994 ◽
Vol 33
(Part 1, No. 1B)
◽
pp. 554-557
◽