Analysis of surface oxides of gas‐evaporated Si small particles with infrared spectroscopy, high‐resolution electron microscopy, and x‐ray photoemission spectroscopy
1985 ◽
Vol 3
(4)
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pp. 1081
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1983 ◽
Vol 41
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pp. 730-731
1995 ◽
Vol 53
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pp. 172-173
1990 ◽
Vol 48
(4)
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pp. 774-775
1989 ◽
Vol 159
(3)
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pp. 245-254
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1992 ◽
Vol 66
(6)
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pp. 873-888
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1990 ◽
Vol 87
(2)
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pp. 308-320
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2001 ◽
Vol 16
(1)
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pp. 101-107
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