Photoassisted Kelvin probe force microscopy at GaN surfaces: The role of polarity

2010 ◽  
Vol 97 (17) ◽  
pp. 172111 ◽  
Author(s):  
J. D. Wei ◽  
S. F. Li ◽  
A. Atamuratov ◽  
H.-H. Wehmann ◽  
A. Waag
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

scholarly journals Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Ting-Xiao Qin ◽  
En-Ming You ◽  
Mao-Xin Zhang ◽  
Peng Zheng ◽  
Xiao-Feng Huang ◽  
...  
Keyword(s):  
Solar Cell ◽  
Grain Boundaries ◽  
Cell Performance ◽  
Kelvin Probe Force Microscopy ◽  
Light Illumination ◽  
Kelvin Probe ◽  
Solar Cell Performance ◽  
Force Microscopy ◽  
Infrared Spectroscopic

AbstractOrganic–inorganic halide perovskites are emerging materials for photovoltaic applications with certified power conversion efficiencies (PCEs) over 25%. Generally, the microstructures of the perovskite materials are critical to the performances of PCEs. However, the role of the nanometer-sized grain boundaries (GBs) that universally existing in polycrystalline perovskite films could be benign or detrimental to solar cell performance, still remains controversial. Thus, nanometer-resolved quantification of charge carrier distribution to elucidate the role of GBs is highly desirable. Here, we employ correlative infrared-spectroscopic nanoimaging by the scattering-type scanning near-field optical microscopy with 20 nm spatial resolution and Kelvin probe force microscopy to quantify the density of electrons accumulated at the GBs in perovskite polycrystalline thin films. It is found that the electron accumulations are enhanced at the GBs and the electron density is increased from 6 × 1019 cm−3 in the dark to 8 × 1019 cm−3 under 10 min illumination with 532 nm light. Our results reveal that the electron accumulations are enhanced at the GBs especially under light illumination, featuring downward band bending toward the GBs, which would assist in electron-hole separation and thus be benign to the solar cell performance.

Band bending in conjugated polymer films: role of morphology and implications for bulk charge transport characteristics

2017 ◽  
Vol 5 (30) ◽  
pp. 7446-7451 ◽  
Author(s):  
J. K. Wenderott ◽  
Ban Xuan Dong ◽  
Peter F. Green
Keyword(s):  
Charge Transport ◽  
Polymer Films ◽  
Conjugated Polymer ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Band Bending ◽  
Force Microscopy ◽  
Bending Effect ◽  
Bulk Charge

The band bending effect depends on the morphology of the conjugated polymer as studied by Kelvin probe force microscopy.

scholarly journals The role of the cantilever in Kelvin probe force microscopy measurements

2011 ◽  
Vol 2 ◽  
pp. 252-260 ◽  
Author(s):  
George Elias ◽  
Thilo Glatzel ◽  
Ernst Meyer ◽  
Alex Schwarzman ◽  
Amir Boag ◽  
...  
Keyword(s):  
Contact Potential Difference ◽  
High Vacuum ◽  
Kelvin Probe Force Microscopy ◽  
Ultra High Vacuum ◽  
Kelvin Probe ◽  
Contact Potential ◽  
Force Microscopy ◽  
Spread Function ◽  
Good Agreement

The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small.

Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

2016 ◽  
Vol 157 ◽  
pp. 71-77 ◽  
Author(s):  
Krzysztof Gajewski ◽  
Witold Szymański ◽  
Piotr Niedzielski ◽  
Teodor Gotszalk
Keyword(s):  
High Strength ◽  
Kelvin Probe Force Microscopy ◽  
Low Density Polyethylene ◽  
Low Density ◽  
Kelvin Probe ◽  
Force Microscopy

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

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