Charge carrier trapping at passivated silicon surfaces

2011 ◽  
Vol 109 (6) ◽  
pp. 064505 ◽  
Author(s):  
Johannes Seiffe ◽  
Marc Hofmann ◽  
Jochen Rentsch ◽  
Ralf Preu
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Haixi Pan ◽  
Liping Feng ◽  
Xiaodong Zhang ◽  
Yang Chen ◽  
Gangquan Li ◽  
...  

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K.P. Korona ◽  
A. Wysmolek ◽  
M. Kamińska ◽  
A. Twardowski ◽  
M. Piersa ◽  
...  

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Vol 171-172 ◽  
pp. 1172-1179 ◽  
Author(s):  
Anne-Marije Andringa ◽  
Nynke Vlietstra ◽  
Edsger C.P. Smits ◽  
Mark-Jan Spijkman ◽  
Henrique L. Gomes ◽  
...  

2020 ◽  
Vol 55 (35) ◽  
pp. 16641-16658
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David Ramírez-Ortega ◽  
Diana Guerrero-Araque ◽  
Próspero Acevedo-Peña ◽  
Luis Lartundo-Rojas ◽  
Rodolfo Zanella

2016 ◽  
Vol 15 (6) ◽  
pp. 628-633 ◽  
Author(s):  
D. Abbaszadeh ◽  
A. Kunz ◽  
G. A. H. Wetzelaer ◽  
J. J. Michels ◽  
N. I. Crăciun ◽  
...  

2018 ◽  
Vol 6 (23) ◽  
pp. 6240-6249 ◽  
Author(s):  
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Pieter Dorenbos

The vacuum referred binding energy (VRBE)-guided design of Bi3+-based storage and afterglow materials together with charge carrier trapping processes is explored with a study on bismuth- and lanthanide-doped rare earth ortho-phosphates.


2019 ◽  
Vol 96 ◽  
pp. 109362 ◽  
Author(s):  
N. Krutyak ◽  
D. Spassky ◽  
V. Nagirnyi ◽  
M. Buryi ◽  
I. Tupitsyna ◽  
...  

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