Static and dynamic behavior of a Si/Si0.8Ge0.2/Si heterojunction bipolar transistor using Monte Carlo simulation

1994 ◽  
Vol 75 (6) ◽  
pp. 2963-2969 ◽  
Author(s):  
Sylvie Galdin ◽  
Philippe Dollfus ◽  
Patrice Hesto
1995 ◽  
Vol 157 (1-4) ◽  
pp. 231-235 ◽  
Author(s):  
Sylvie Galdin ◽  
Philippe Dollfus ◽  
Mireille Mouis ◽  
Françoise Meyer ◽  
Patrice Hesto

1994 ◽  
Vol 41 (3) ◽  
pp. 619-624 ◽  
Author(s):  
C. Brisset ◽  
P. Dollfus ◽  
P. Hesto ◽  
O. Musseau

1986 ◽  
Vol 33 (7) ◽  
pp. 881-888 ◽  
Author(s):  
C.M. Maziar ◽  
M.E. Klausmeier-Brown ◽  
S. Bandyopadhyay ◽  
M.S. Lundstrom ◽  
S. Datta

VLSI Design ◽  
1998 ◽  
Vol 8 (1-4) ◽  
pp. 387-391 ◽  
Author(s):  
B. Neinhüs ◽  
S. Decker ◽  
P. Graf ◽  
F. M. Bufler ◽  
B. Meinerzhagen

Good agreement between a hydrodynamic and a Monte-Carlo device model is demonstrated in this paper for an advanced SiGe Heterojunction Bipolar Transistor. This result is based on two principles: 1) Extraction (from the Monte-Carlo bulk model under homogeneous conditions) of the relaxation times τ at discrete points of the parameter space spanned by the Ge-content x, doping density N, carrier temperature TC and lattice temperature TL. 2) Modeling of the relaxation times τ(x,  TC,  TL) by splines.


Sign in / Sign up

Export Citation Format

Share Document