Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube

Atomic Force ◽

2021 IEEE 34th International Conference on Micro Electro Mechanical Systems (MEMS) ◽

Design, Fabrication and Characterization of Active Atomic Force Microscope Cantilever Arrays

10.1109/mems51782.2021.9375345 ◽

2021 ◽

Author(s):

Mohammadreza Soleymaniha ◽

M. Bulut Coskun ◽

Hazhir Mahmoodi Nasrabadi ◽

Afshin Alipour ◽

S. O. Reza Moheimani

Keyword(s):

Atomic Force Microscope ◽

Cantilever Arrays ◽

Atomic Force ◽

Fabrication And Characterization ◽

Mechanical characterization of nanofibers using a nanomanipulator and atomic force microscope cantilever in a scanning electron microscope

Polymer Testing ◽

10.1016/j.polymertesting.2010.01.002 ◽

2010 ◽

Vol 29 (3) ◽

pp. 375-380 ◽

Cited By ~ 32

Author(s):

Kenny Yoonki Hwang ◽

Sung-Dae Kim ◽

Young-Woon Kim ◽

Woong-Ryeol Yu

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Atomic Force Microscope ◽

Mechanical Characterization ◽

Atomic Force ◽

Force Microscope Cantilever ◽

Scanning Electron

Influence of atomic force microscope cantilever tilt and induced torque on force measurements

Journal of Applied Physics ◽

10.1063/1.2885734 ◽

2008 ◽

Vol 103 (6) ◽

pp. 064513 ◽

Cited By ~ 35

Author(s):

Scott A. Edwards ◽

William A. Ducker ◽

John E. Sader

Keyword(s):

Atomic Force Microscope ◽

Force Measurements ◽

Atomic Force ◽

Atomic force microscope cantilever based microcoordinate measuring probe for true three-dimensional measurements of microstructures

Applied Physics Letters ◽

10.1063/1.2786881 ◽

2007 ◽

Vol 91 (12) ◽

pp. 121912 ◽

Cited By ~ 15

Author(s):

Gaoliang Dai ◽

Helmut Wolff ◽

Hans-Ulrich Danzebrink

Keyword(s):

Atomic Force Microscope ◽

Three Dimensional ◽

Atomic Force ◽

Measuring Probe ◽

Dimensional Measurements ◽

Improved Nanotopography Sensing via Temperature Control of a Heated Atomic Force Microscope Cantilever

IEEE Sensors Journal ◽

10.1109/jsen.2011.2157121 ◽

2011 ◽

Vol 11 (11) ◽

pp. 2664-2670 ◽

Cited By ~ 12

Author(s):

Suhas Somnath ◽

Elise A. Corbin ◽

William P. King

Keyword(s):

Atomic Force Microscope ◽

Temperature Control ◽

Atomic Force ◽

Eigenfrequencies of a rectangular atomic force microscope cantilever in a medium

Journal of Applied Physics ◽

10.1063/1.365379 ◽

1997 ◽

Vol 81 (12) ◽

pp. 7709-7714 ◽

Cited By ~ 74

Author(s):

Franz-Josef Elmer ◽

Markus Dreier

Keyword(s):

Atomic Force Microscope ◽

Atomic Force ◽

Next generation of heated atomic force microscope cantilever for nanolithography: modelling, simulation, and nanofabrication

Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019 ◽

10.1117/12.2514686 ◽

2019 ◽

Author(s):

Mohammadreza Soleymaniha ◽

Jonathan R. Felts

Keyword(s):

Atomic Force Microscope ◽

Next Generation ◽

Atomic Force ◽

Modelling Simulation ◽

Dynamic analysis of flexural vibration mode of an atomic force microscope cantilever with a sidewall probe in liquid

Microscopy Research and Technique ◽

10.1002/jemt.23636 ◽

2020 ◽

Author(s):

Amir F. Payam ◽

Nguyen Duy Vy

Keyword(s):

Dynamic Analysis ◽

Atomic Force Microscope ◽

Vibration Mode ◽

Flexural Vibration ◽

Atomic Force ◽

MEMS and Nanotechnology, Volume 2 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

Small mass measurements for tuning fork-based atomic force microscope cantilever spring constant calibration

10.1007/978-1-4419-8825-6_8 ◽

2011 ◽

pp. 49-56 ◽

Cited By ~ 3

Author(s):

Gordon A. Shaw ◽

Jon R. Pratt ◽

Zeina J. Jabbour

Keyword(s):

Atomic Force Microscope ◽

Tuning Fork ◽

Small Mass ◽

Spring Constant ◽

Mass Measurements ◽

Atomic Force ◽

Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods

Measurement Science and Technology ◽

10.1088/0957-0233/20/12/125501 ◽

2009 ◽

Vol 20 (12) ◽

pp. 125501 ◽

Cited By ~ 26

Author(s):

Charles A Clifford ◽

Martin P Seah

Keyword(s):

Uncertainty Analysis ◽

Atomic Force Microscope ◽

Experimental Methods ◽

Spring Constant ◽

Atomic Force ◽

Improved Methods ◽