Identification of boron clusters in silicon crystal by B1s core-level X-ray photoelectron spectroscopy: A first-principles study

2011 ◽  
Vol 99 (19) ◽  
pp. 191901 ◽  
Author(s):  
Jun Yamauchi ◽  
Yoshihide Yoshimoto ◽  
Yuji Suwa
2011 ◽  
Author(s):  
Jun Yamauchi ◽  
Yoshihide Yoshimoto ◽  
Jisoon Ihm ◽  
Hyeonsik Cheong

2019 ◽  
Vol 470 ◽  
pp. 607-612 ◽  
Author(s):  
Martin Magnuson ◽  
Grzegorz Greczynski ◽  
Fredrik Eriksson ◽  
Lars Hultman ◽  
Hans Högberg

2018 ◽  
Vol 20 (13) ◽  
pp. 8403-8410 ◽  
Author(s):  
Francesc Viñes ◽  
Carmen Sousa ◽  
Francesc Illas

Core level binding energies, measured by X-ray photoelectron spectroscopy providing unique information regarding the chemical environment of atoms in a system, can be estimated by a diversity of state-of-the-art accurate methods here detailed.


2018 ◽  
Vol 123 (1) ◽  
pp. 347-355 ◽  
Author(s):  
Mahsa Ebadi ◽  
Antoine Nasser ◽  
Marco Carboni ◽  
Reza Younesi ◽  
Cleber F. N. Marchiori ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document