First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal

2014 ◽  
Author(s):  
Hiroki Kishi ◽  
Miki Miyazawa ◽  
Naoki Matsushima ◽  
Jun Yamauchi
2011 ◽  
Author(s):  
Jun Yamauchi ◽  
Yoshihide Yoshimoto ◽  
Jisoon Ihm ◽  
Hyeonsik Cheong

2019 ◽  
Vol 470 ◽  
pp. 607-612 ◽  
Author(s):  
Martin Magnuson ◽  
Grzegorz Greczynski ◽  
Fredrik Eriksson ◽  
Lars Hultman ◽  
Hans Högberg

2018 ◽  
Vol 20 (13) ◽  
pp. 8403-8410 ◽  
Author(s):  
Francesc Viñes ◽  
Carmen Sousa ◽  
Francesc Illas

Core level binding energies, measured by X-ray photoelectron spectroscopy providing unique information regarding the chemical environment of atoms in a system, can be estimated by a diversity of state-of-the-art accurate methods here detailed.


2018 ◽  
Vol 123 (1) ◽  
pp. 347-355 ◽  
Author(s):  
Mahsa Ebadi ◽  
Antoine Nasser ◽  
Marco Carboni ◽  
Reza Younesi ◽  
Cleber F. N. Marchiori ◽  
...  

2019 ◽  
Vol 21 (18) ◽  
pp. 9399-9406 ◽  
Author(s):  
Marc Figueras ◽  
Carmen Sousa ◽  
Francesc Illas

The influence of electron correlation into the decomposition of core level binding energy shifts, measured by X-ray photoelectron spectroscopy (XPS), into initial and final effects is analysed for a series of molecules where these effects are noticeable.


2004 ◽  
Vol 95 (4) ◽  
pp. 1963-1968 ◽  
Author(s):  
J. Eng ◽  
I. A. Hubner ◽  
J. Barriocanal ◽  
R. L. Opila ◽  
D. J. Doren

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