X-ray photoelectron spectroscopy analysis of boron defects in silicon crystal: A first-principles study

Jun Yamauchi; Yoshihide Yoshimoto; Yuji Suwa

doi:10.1063/1.4948572

X-ray photoelectron spectroscopy analysis of boron defects in silicon crystal: A first-principles study

Journal of Applied Physics ◽

10.1063/1.4948572 ◽

2016 ◽

Vol 119 (17) ◽

pp. 175704 ◽

Cited By ~ 6

Author(s):

Jun Yamauchi ◽

Yoshihide Yoshimoto ◽

Yuji Suwa

Keyword(s):

First Principles ◽

Photoelectron Spectroscopy ◽

Silicon Crystal ◽

Spectroscopy Analysis ◽

X Ray ◽

First Principles Study

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Identification of boron clusters in silicon crystal by B1s core-level X-ray photoelectron spectroscopy: A first-principles study

Applied Physics Letters ◽

10.1063/1.3658030 ◽

2011 ◽

Vol 99 (19) ◽

pp. 191901 ◽

Cited By ~ 18

Author(s):

Jun Yamauchi ◽

Yoshihide Yoshimoto ◽

Yuji Suwa

Keyword(s):

First Principles ◽

Photoelectron Spectroscopy ◽

Silicon Crystal ◽

Core Level ◽

X Ray ◽

Boron Clusters ◽

First Principles Study

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Core-level shifts in x-ray photoelectron spectroscopy of arsenic defects in silicon crystal: A first-principles study

AIP Advances ◽

10.1063/5.0025316 ◽

2020 ◽

Vol 10 (11) ◽

pp. 115301

Author(s):

Jun Yamauchi ◽

Yoshihide Yoshimoto ◽

Yuji Suwa

Keyword(s):

First Principles ◽

Photoelectron Spectroscopy ◽

Silicon Crystal ◽

Core Level ◽

X Ray ◽

First Principles Study ◽

Level Shifts

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X-ray Photoelectron Spectroscopy for the Boron Impurities in Silicon: a First-Principles Study

10.1063/1.3666271 ◽

2011 ◽

Author(s):

Jun Yamauchi ◽

Yoshihide Yoshimoto ◽

Jisoon Ihm ◽

Hyeonsik Cheong

Keyword(s):

First Principles ◽

Photoelectron Spectroscopy ◽

X Ray ◽

First Principles Study

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Elemental Core Level Shift in High Entropy Alloy Nanoparticles via X-ray Photoelectron Spectroscopy Analysis and First-Principles Calculation

ACS Nano ◽

10.1021/acsnano.0c09470 ◽

2020 ◽

Vol 14 (12) ◽

pp. 17704-17712

Author(s):

Xiang Xu ◽

Yang Guo ◽

Brian P. Bloom ◽

Jianjun Wei ◽

Haoyang Li ◽

...

Keyword(s):

First Principles ◽

Photoelectron Spectroscopy ◽

First Principles Calculation ◽

Level Shift ◽

High Entropy Alloy ◽

Alloy Nanoparticles ◽

Spectroscopy Analysis ◽

X Ray ◽

High Entropy ◽

Core Level Shift

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First-principles core-level X-ray photoelectron spectroscopy calculation on arsenic defects in silicon crystal

10.1063/1.4865641 ◽

2014 ◽

Author(s):

Hiroki Kishi ◽

Miki Miyazawa ◽

Naoki Matsushima ◽

Jun Yamauchi

Keyword(s):

First Principles ◽

Photoelectron Spectroscopy ◽

Silicon Crystal ◽

Core Level ◽

X Ray

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Band alignments at interface of Cu2ZnSnS4/ZnO heterojunction: An X-ray photoelectron spectroscopy and first-principles study

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2014.12.174 ◽

2015 ◽

Vol 628 ◽

pp. 293-297 ◽

Cited By ~ 22

Author(s):

Gang Yang ◽

Yong-Feng Li ◽

Bin Yao ◽

Zhan-Hui Ding ◽

Rui Deng ◽

...

Keyword(s):

First Principles ◽

Photoelectron Spectroscopy ◽

X Ray ◽

First Principles Study ◽

Band Alignments

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X-ray spectra in the magnetic van der Waals materials Fe3GeTe2, CrI3, and CrGeTe3 : A first-principles study

Physical Review B ◽

10.1103/physrevb.103.134407 ◽

2021 ◽

Vol 103 (13) ◽

Author(s):

Y. Lee ◽

V. N. Antonov ◽

B. N. Harmon ◽

Liqin Ke

Keyword(s):

First Principles ◽

Van Der Waals ◽

X Ray ◽

First Principles Study ◽

Van Der Waals Materials

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X‐ray photoelectron spectroscopy analysis of photostimulated chemical vapor deposition hydrogenated amorphous silicon/amorphous aluminum oxide

Applied Physics Letters ◽

10.1063/1.107407 ◽

1992 ◽

Vol 60 (10) ◽

pp. 1208-1210 ◽

Cited By ~ 1

Author(s):

K. Uwasawa ◽

F. Ishihara ◽

S. Matsumoto

Keyword(s):

Chemical Vapor Deposition ◽

Aluminum Oxide ◽

Amorphous Silicon ◽

Vapor Deposition ◽

Photoelectron Spectroscopy ◽

Hydrogenated Amorphous Silicon ◽

Chemical Vapor ◽

Spectroscopy Analysis ◽

X Ray ◽

Hydrogenated Amorphous

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Electronic structure of β-Ta films from X-ray photoelectron spectroscopy and first-principles calculations

Applied Surface Science ◽

10.1016/j.apsusc.2018.11.096 ◽

2019 ◽

Vol 470 ◽

pp. 607-612 ◽

Cited By ~ 4

Author(s):

Martin Magnuson ◽

Grzegorz Greczynski ◽

Fredrik Eriksson ◽

Lars Hultman ◽

Hans Högberg

Keyword(s):

Electronic Structure ◽

First Principles ◽

Photoelectron Spectroscopy ◽

First Principles Calculations ◽

X Ray

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X-ray photoelectron spectroscopy and positron annihilation spectroscopy analysis of surfactant affected FePt spintronic films

Applied Surface Science ◽

10.1016/j.apsusc.2014.04.190 ◽

2014 ◽

Vol 308 ◽

pp. 408-413 ◽

Cited By ~ 1

Author(s):

Chun Feng ◽

Xujing Li ◽

Fen Liu ◽

Qiang Wang ◽

Meiyin Yang ◽

...

Keyword(s):

Positron Annihilation ◽

Photoelectron Spectroscopy ◽

Positron Annihilation Spectroscopy ◽

Spectroscopy Analysis ◽

X Ray

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