Effect of preoxidation on deposition of thin gate-quality silicon oxide film at low temperature by using a sputter-type electron cyclotron resonance plasma
1997 ◽
Vol 15
(4)
◽
pp. 1951-1954
◽
1998 ◽
Vol 317
(1-2)
◽
pp. 116-119
◽
1990 ◽
Vol 29
(Part 2, No. 7)
◽
pp. L1181-L1184
◽
2007 ◽
Vol 25
(4)
◽
pp. 1166
◽
1999 ◽
Vol 38
(Part 2, No. 3A)
◽
pp. L220-L222
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1995 ◽
Vol 13
(5)
◽
pp. 2427-2434
◽
2001 ◽
Vol 34
(7)
◽
pp. 1025-1031