Effect of preoxidation on deposition of thin gate-quality silicon oxide film at low temperature by using a sputter-type electron cyclotron resonance plasma

1997 ◽  
Vol 82 (11) ◽  
pp. 5680-5685 ◽  
Author(s):  
D. W. Gao ◽  
Y. Kashiwazaki ◽  
K. Muraoka ◽  
H. Nakashima ◽  
K. Furukawa ◽  
...  
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