Active-layer thickness effects related with microstructure, electrical properties and flicker noise in polycrystalline ZnO thin film transistors

2011 ◽  
Author(s):  
K. S. Jeong ◽  
Y. M. Kim ◽  
J. G. Park ◽  
S. D. Yang ◽  
Y. S. Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Layer Thickness ◽  
Active Layer ◽  
Thin Film Transistors ◽  
Flicker Noise ◽  
Active Layer Thickness ◽  
Zno Thin Film

Active-layer Thickness Effects Related to the Threshold Voltage and Mobility Degradation in Poly-crystalline ZnO Thin-Film Transistors

2011 ◽  
Vol 58 (5(1)) ◽  
pp. 1307-1311 ◽  
Author(s):  
Kwang-Seok Jeong ◽  
Yu-Mi Kim ◽  
Jeong-Gyu Park ◽  
Seung-Dong Yang ◽  
Ho-Jin Yun ◽  
...  
Keyword(s):  
Thin Film ◽  
Layer Thickness ◽  
Active Layer ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Active Layer Thickness ◽  
Zno Thin Film ◽  
Mobility Degradation

The impact of active layer thickness on low-frequency noise characteristics in InZnO thin-film transistors with high mobility

2012 ◽  
Vol 100 (17) ◽  
pp. 173501 ◽  
Author(s):  
Hyun-Sik Choi ◽  
Sanghun Jeon ◽  
Hojung Kim ◽  
Jaikwang Shin ◽  
Changjung Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Layer Thickness ◽  
Active Layer ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
High Mobility ◽  
Active Layer Thickness ◽  
Frequency Noise ◽  
Noise Characteristics ◽  
The Impact
Sign in / Sign up

Export Citation Format

Share Document