An atomic force microscopy study of the surface morphology of InP/GaAs heteroepitaxial layers subjected to rapid thermal annealing

1998 ◽  
Vol 83 (1) ◽  
pp. 246-249 ◽  
Author(s):  
Ferenc Riesz ◽  
C. Vignali ◽  
C. Pelosi ◽  
K. Rakennus ◽  
T. Hakkarainen
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