Atomic force microscopy study of surface morphology of GaAs grown by atomic layer epitaxy using trimethylgallium and arsine

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587246 ◽

1994 ◽

Vol 12 (3) ◽

pp. 1623 ◽

Author(s):

Seong-Ju Park

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Atomic Layer ◽

Microscopy Study ◽

Atomic Layer Epitaxy ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Atomic force microscopy study of titanium dioxide thin films grown by atomic layer epitaxy

Thin Solid Films ◽

10.1016/0040-6090(93)90557-6 ◽

1993 ◽

Vol 228 (1-2) ◽

pp. 32-35 ◽

Author(s):

Mikko Ritala ◽

Markku Leskelä ◽

Leena-Sisko Johansson ◽

Lauri Niinistö

Keyword(s):

Atomic Force Microscopy ◽

Titanium Dioxide ◽

Atomic Layer ◽

Microscopy Study ◽

Atomic Layer Epitaxy ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Titanium Dioxide Thin Films

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An Atomic Force Microscopy Study of the Surface Morphology of Hyperbranched Poly(acrylic acid) Thin Films

Advanced Materials ◽

10.1002/(sici)1521-4095(199911)11:16<1368::aid-adma1368>3.0.co;2-y ◽

1999 ◽

Vol 11 (16) ◽

pp. 1368-1371 ◽

Author(s):

W. M. Lackowski ◽

J. G. Franchina ◽

D. E. Bergbreiter ◽

R. M. Crooks

Keyword(s):

Atomic Force Microscopy ◽

Acrylic Acid ◽

Surface Morphology ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Hyperbranched Poly ◽

Poly Acrylic Acid

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Atomic force microscopy study on surface morphology of {0 0 1} faces of [MnHg(SCN) 4 (H 2 O) 2 ]·2C 4 H 9 NO crystals

Applied Surface Science ◽

10.1016/j.apsusc.2006.07.085 ◽

2007 ◽

Vol 253 (7) ◽

pp. 3674-3677 ◽

Author(s):

X.J. Liu ◽

D. Xu ◽

G.W. Yu ◽

X.Q. Wang ◽

L.Y. Zhu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Effect of the Electrosynthesis Method on the Surface Morphology of the Polypyrrole Film An Atomic Force Microscopy Study

Journal of The Electrochemical Society ◽

10.1149/1.1365143 ◽

2001 ◽

Vol 148 (5) ◽

pp. C369 ◽

Author(s):

T. Hernández-Pérez ◽

M. Morales ◽

N. Batina ◽

M. Salmón

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Polypyrrole Film

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Atomic Force Microscopy Study of Surface Morphology of Zinc‐Iron Electrodeposits

Journal of The Electrochemical Society ◽

10.1149/1.1837436 ◽

1997 ◽

Vol 144 (2) ◽

pp. 481-484 ◽

Author(s):

F. Czerwinski ◽

K. Kondo ◽

J. A. Szpunar

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Atomic force microscopy study of Si(111) surface morphology and electrical characteristics of Pd/n-Si schottky diodes: effect of cleaning procedures

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199809)26:10<748::aid-sia424>3.0.co;2-f ◽

1998 ◽

Vol 26 (10) ◽

pp. 748-757 ◽

Author(s):

P. N. K. Deenapanray ◽

F. D. Auret ◽

G. Myburg ◽

K. T. Hillie ◽

C. M. Demanet

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Schottky Diodes ◽

Microscopy Study ◽

Electrical Characteristics ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Cleaning Procedures

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Atomic force microscopy study of surface morphology change in spinel LiMn2O4: Possibility of direct observation of Jahn–Teller instability

Surface Science ◽

10.1016/j.susc.2007.03.025 ◽

2007 ◽

Vol 601 (10) ◽

pp. 2256-2259 ◽

Author(s):

K. Kuriyama ◽

A. Onoue ◽

Y. Yuasa ◽

K. Kushida

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Direct Observation ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Spinel Limn2o4 ◽

Force Microscopy ◽

Morphology Change ◽

Atomic Force ◽

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An atomic force microscopy study of the surface morphology of InP/GaAs heteroepitaxial layers subjected to rapid thermal annealing

Journal of Applied Physics ◽

10.1063/1.366733 ◽

1998 ◽

Vol 83 (1) ◽

pp. 246-249 ◽

Author(s):

Ferenc Riesz ◽

C. Vignali ◽

C. Pelosi ◽

K. Rakennus ◽

T. Hakkarainen

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Thermal Annealing ◽

Rapid Thermal Annealing ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Heteroepitaxial Layers

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Atomic force microscopy study of the surface morphology of a TlGaSe2 crystal

Inorganic Materials ◽

10.1134/s0020168509120048 ◽

2009 ◽

Vol 45 (12) ◽

pp. 1333-1336

Author(s):

E. M. Gojaev ◽

S. R. Jafarova

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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Nano-structural signs of the cortical bone fragility: atomic force microscopy study in the femoral neck of elderly hip fracture patients and healthy aged controls

Bone Abstracts ◽

10.1530/boneabs.1.pp48 ◽

2013 ◽

Author(s):

Petar Milovanovic ◽

Zlatko Rakocevic ◽

Jelena Potocnik ◽

Danijela Djonic ◽

Vladimir Zivkovic ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Hip Fracture ◽

Femoral Neck ◽

Cortical Bone ◽

Microscopy Study ◽

Bone Fragility ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

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