scholarly journals Resonant control of an atomic force microscope micro-cantilever for active Q control

2012 ◽  
Vol 83 (8) ◽  
pp. 083708 ◽  
Author(s):  
M. Fairbairn ◽  
S. O. R. Moheimani
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Micro Cantilever ◽  
Resonant Control

Micro-Cantilever Based Metrology Tool for Flow Characterization of Liquid and Gaseous Micro/Nanojets

2005 ◽  
Author(s):  
Jungchul Lee ◽  
Kianoush Naeli ◽  
Hanif Hunter ◽  
John Berg ◽  
Tanya Wright ◽  
...  
Keyword(s):  
Heat Flux ◽  
Atomic Force Microscope ◽  
Temporal Resolution ◽  
Cantilever Sensors ◽  
Atomic Force ◽  
Flow Characterization ◽  
Local Measurements ◽  
Micro Cantilever ◽  
Tools And Techniques

This paper reports the development of MEMS metrology tools to characterize liquid and gaseous jets ejected from micro/nanofabricated nozzles. To date few highly local measurements have been made on micro/nanojets, due in part to the lack of characterization tools and techniques to investigate their characteristics. Atomic force microscope cantilevers are well-suited for interrogating these flows due to their high spatial and temporal resolution. In this work, cantilever sensors with either integrated heating elements or piezoresistive elements have been fabricated to measure thrust, velocity, and heat flux characteristics of micro/nanojets.

Increasing the Image Contrast of Atomic Force Microscope by Using Improved Rectangular Micro Cantilever

2011 ◽  
Vol 110-116 ◽  
pp. 4888-4892
Author(s):  
Ali Sadeghi
Keyword(s):  
Atomic Force Microscope ◽  
Contact Stiffness ◽  
Beam Theory ◽  
Flexural Vibration ◽  
Sample Surface ◽  
Limited Range ◽  
Image Contrast ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Micro Cantilever

The resonant frequency of flexural vibrations for an atomic force microscope (AFM) cantilever has been investigated using the Euler-Bernoulli beam theory. The results show that for flexural vibration the frequency is sensitive to the contact position, the first frequency is sensitive only to the lower contact stiffness, but high order modes are sensitive in a larger range of contact stiffness. By increasing the height H, for a limited range of contact stiffness the sensitivity to the contact stiffness increases. This sensitivity controls the image contrast, or image quality. Furthermore, by increasing the angle between the cantilever and sample surface, the frequency decreases.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Sign in / Sign up

Export Citation Format

Share Document