Micro-Cantilever Based Metrology Tool for Flow Characterization of Liquid and Gaseous Micro/Nanojets

This paper reports the development of MEMS metrology tools to characterize liquid and gaseous jets ejected from micro/nanofabricated nozzles. To date few highly local measurements have been made on micro/nanojets, due in part to the lack of characterization tools and techniques to investigate their characteristics. Atomic force microscope cantilevers are well-suited for interrogating these flows due to their high spatial and temporal resolution. In this work, cantilever sensors with either integrated heating elements or piezoresistive elements have been fabricated to measure thrust, velocity, and heat flux characteristics of micro/nanojets.

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Characterization of photosystem II with the atomic-force microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130365 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1146-1147

Author(s):

Kathleen M. Marr ◽

Mary K. Lyon

Keyword(s):

Photosystem Ii ◽

Atomic Force Microscope ◽

Three Dimensional ◽

Biologically Active ◽

Atomic Force ◽

Freeze Etching ◽

Image Averaging ◽

Oxygen Evolving ◽

Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

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Digital light processing in a hybrid atomic force microscope: In Situ, nanoscale characterization of the printing process

Additive Manufacturing ◽

10.1016/j.addma.2020.101744 ◽

2021 ◽

Vol 38 ◽

pp. 101744

Author(s):

Callie I. Higgins ◽

Tobin E. Brown ◽

Jason P. Killgore

Keyword(s):

Atomic Force Microscope ◽

Digital Light Processing ◽

Printing Process ◽

Atomic Force ◽

Nanoscale Characterization

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Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

Journal of Synchrotron Radiation ◽

10.1107/s1600577516011437 ◽

2016 ◽

Vol 23 (5) ◽

pp. 1110-1117 ◽

Cited By ~ 3

Author(s):

M. V. Vitorino ◽

Y. Fuchs ◽

T. Dane ◽

M. S. Rodrigues ◽

M. Rosenthal ◽

...

Keyword(s):

Thin Film ◽

Atomic Force Microscope ◽

High Speed ◽

Normal Incidence ◽

Organic Thin Film ◽

X Ray ◽

Atomic Force ◽

Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

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