Probing temperature gradients within the GaN buffer layer of AlGaN/GaN high electron mobility transistors with Raman thermography

2014 ◽  
Vol 115 (6) ◽  
pp. 064504 ◽  
Author(s):  
C. Hodges ◽  
J. Pomeroy ◽  
M. Kuball
2019 ◽  
Vol 45 (8) ◽  
pp. 761-764
Author(s):  
T. V. Malin ◽  
D. S. Milakhin ◽  
I. A. Aleksandrov ◽  
V. E. Zemlyakov ◽  
V. I. Egorkin ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document