A fluorescence XAFS measurement instrument in the soft x-ray region toward observation under operando conditions

Perancangan pH meter berbasis Arduino dilakukan untuk membuat alat ukur pH yang kompatibel dengan alat mesin pencuci film otomatis. Pengukuran pH pada larutan fixer sangat diperlukan karena tingkat pH sangat berpengaruh terhadap hasil citra radiografi. Pada penelitian ini telah dilakukan rancang bangun pH meter berbasis arduino uno. Rancang bangun alat ini menggunakan sensor E-201C, arduino uno, dan tampilan PC. Pengambilan data dilakukan menggunakan variasi larutan buffer. Hasil dari karakterisasi sensor menunjukkan sensor memiliki nilai sensitivitas 46,2mV/pH pada suhu 28oC. Pengukuran pada larutan asam menghasilkan tegangan sensor bernilai positif, larutan netral menghasilkan tegangan sensor mendekati nol, dan larutan basa menghasilkan tegangan sensor bernilai negatif. Berdasarkan hasil pengujian, pH meter yang dibuat mampu mengukur rentang nilai pH 1,6 sampai dengan 11 dengan ketelitian 99% dan layak digunakan sebagai alat ukur pH pada mesin pencuci film radiografi.Kata Kunci : Larutan fixer, sensor E-201C, arduino uno, pH meter Abstract Design of pH meter based on Arduino had done to create pH measurement instrument that compatible with automatic washing machine of x-ray radiograph film. The pH Measurement on buffer solution is important because acidic level extremely effect to result of radiograph image. In this research, the design of pH meter based on arduino uno has been performed. Sensor of E-201C, arduino uno an display PC used to designed of pH meter. Buffer solution has variated to get a data result. The result of sensor characterization shows that the sensitivity of the sensor is about 46.2mV/pH in the temperature of 28C. Measurement of acidic solution give result of positive voltage, netral solution voltage of limit to zero, and basic solution of negative voltage. According to the examination result, pH meter has made as can measure pH with ranges of 1,6 to 11 with 99% accuracy and proper to use as a pH measuring instrument to wash film radiography equipment.Keywords : Buffer Solution, Sensor of E-201C, Arduino uno, pH meter

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Standard Sample Package for Calibration of X-Ray Stress Measurement

Materials Science Forum ◽

10.4028/www.scientific.net/msf.768-769.242 ◽

2013 ◽

Vol 768-769 ◽

pp. 242-245

Author(s):

Shoichi Yasukawa ◽

Tatsuki Miyoshi ◽

Masayuki Yamamoto ◽

Takashi Yamamoto ◽

Shinichi Ohya

Keyword(s):

Residual Stress ◽

Standard Sample ◽

Stress Measurement ◽

Bulk Material ◽

Measurement Instrument ◽

Powder Particle Size ◽

Standard Samples ◽

Beam Position ◽

X Ray ◽

Wide Range

The purpose of our study is to provide standard samples for X-ray stress measurement. Typically zero adjustment is performed by a stress free sample which is a fine powder of pure metal. However, if the sample has stress (not stress-free), the stress value obtained by measurement can contain the errors caused by each stress measurement instrument. To solve this instrumental error, we have created a standard sample package. The sample package includes the following three samples. 1) Fluorescent powder to confirm the beam position and size. 2) Iron powder (particle size 6-8μm) to calibrate the zero-stress. 3) Bulk iron material which has approx. -100(MPa) of residual stress. Each sample has been laid out in a 6mm thick plate, and each sample can be selected by sliding the plate manually. By measuring the bulk material and the powder, correction and calibration of the stress measurement instrument is possible. The manufacturing process employed in this study has confirmed that the iron bulk material does not have residual stress and FWHM changes over time in the past 20 years. Therefore, the standard sample can be used semi permanently by adequate management. Correction of instrument by using this standard sample package increases the reliability of X-ray stress measurement method which will help to employ it in a wide range of practical uses.

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FPGA based temperature control and monitoring system for X-ray measurement instrument

2016 IEEE Region 10 Conference (TENCON) ◽

10.1109/tencon.2016.7848651 ◽

2016 ◽

Cited By ~ 2

Author(s):

Keyur K. Mahant ◽

Amit V. Patel ◽

Alpesh Vala ◽

Riddhi Goswami

Keyword(s):

Monitoring System ◽

Temperature Control ◽

Measurement Instrument ◽

X Ray ◽

Control And Monitoring System

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New transmission-type X-ray filters consisting of amorphous multilayer films

Journal of Synchrotron Radiation ◽

10.1107/s0909049598001496 ◽

1998 ◽

Vol 5 (3) ◽

pp. 603-605

Author(s):

Yasuo Takagi ◽

Muneyuki Imafuku

Keyword(s):

Multilayer Films ◽

X Rays ◽

Solid State Detector ◽

Sputtering Deposition ◽

X Ray ◽

Dependent Absorption ◽

Diffraction Peaks ◽

Sputter Deposited ◽

Fluorescence Xafs ◽

State Detector

New transmission-type X-ray filters have been developed. The filters consist of X-ray-amorphous metal (less than 30 Å)/metalloid (∼10 Å) multilayer films sputter-deposited on X-ray-transparent polymer substrates. Such metal/metalloid multilayer films show only very broad diffraction peaks, since the metal and metalloid layers forming the multilayer films are usually X-ray amorphous if the layers are sufficiently thin. The filters use the wavelength-dependent absorption phenomena near absorption edges of elements to reduce the intensity of transmitted X-rays, without generating any crystalline sharp peaks which cause serious problems in experiments such as fluorescence XAFS measurements. The multilayer-film filters were prepared by a multi-target magnetron sputtering deposition technique, paying special attention to the homogeneity of the layer thickness by spinning substrates of the films. The filters are useful in reducing the intensity of undesirable fluorescence emissions and improving the signal-to-background ratios of data acquired in various measurements using a solid-state detector.

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