scholarly journals Phase formation, thermal stability and magnetic moment of cobalt nitride thin films

AIP Advances ◽  
2015 ◽  
Vol 5 (9) ◽  
pp. 097131 ◽  
Author(s):  
Rachana Gupta ◽  
Nidhi Pandey ◽  
Akhil Tayal ◽  
Mukul Gupta
2018 ◽  
Vol 149 ◽  
pp. 150-154 ◽  
Author(s):  
H. Riedl ◽  
T. Glechner ◽  
T. Wojcik ◽  
N. Koutná ◽  
S. Kolozsvári ◽  
...  

2015 ◽  
Vol 650 ◽  
pp. 647-653 ◽  
Author(s):  
Akhil Tayal ◽  
Mukul Gupta ◽  
Nidhi Pandey ◽  
Ajay Gupta ◽  
Michael Horisberger ◽  
...  

2020 ◽  
Vol 838 ◽  
pp. 155580
Author(s):  
Felipe Cemin ◽  
Mawin J.M. Jimenez ◽  
Leonardo M. Leidens ◽  
Carlos A. Figueroa ◽  
Fernando Alvarez

2013 ◽  
Vol 536 ◽  
pp. 39-49 ◽  
Author(s):  
Akhil Tayal ◽  
Mukul Gupta ◽  
Ajay Gupta ◽  
M. Horisberger ◽  
J. Stahn

Author(s):  
G. Lucadamo ◽  
K. Barmak ◽  
C. Michaelsen

The subject of reactive phase formation in multilayer thin films of varying periodicity has stimulated much research over the past few years. Recent studies have sought to understand the reactions that occur during the annealing of Ni/Al multilayers. Dark field imaging from transmission electron microscopy (TEM) studies in conjunction with in situ x-ray diffraction measurements, and calorimetry experiments (isothermal and constant heating rate), have yielded new insights into the sequence of phases that occur during annealing and the evolution of their microstructure.In this paper we report on reactive phase formation in sputter-deposited lNi:3Al multilayer thin films with a periodicity A (the combined thickness of an aluminum and nickel layer) from 2.5 to 320 nm. A cross-sectional TEM micrograph of an as-deposited film with a periodicity of 10 nm is shown in figure 1. This image shows diffraction contrast from the Ni grains and occasionally from the Al grains in their respective layers.


2021 ◽  
Vol 46 (5) ◽  
pp. 4137-4153
Author(s):  
Neha Verma ◽  
Rob Delhez ◽  
Niek M. van der Pers ◽  
Frans D. Tichelaar ◽  
Amarante J. Böttger

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