scholarly journals The effect of ecthing duration on structural properties of porous Si fabricated by a new two-steps alternating current photo-assisted electrochemical etching (ACPEC) technique for MSM photodetector

Author(s):  
Rosfariza Radzali ◽  
Muhammad Zulhilmi Zakariah ◽  
Ainorkhilah Mahmood ◽  
Alhan Farhanah Abd Rahim ◽  
Zainuriah Hassan ◽  
...  
2016 ◽  
Vol 846 ◽  
pp. 274-282
Author(s):  
Ainorkhilah Mahmood ◽  
Zainuriah Hassan ◽  
Naser Mahmoud Ahmed ◽  
Ellis Shahiri ◽  
Alhan Farhanah Abd Rahim ◽  
...  

The formation of nanocrystalline porous silicon (PS) was successfully prepared under a novel alternating current (sine-wave a.c. (50 Hz)) photo-assisted electrochemical (ACPEC) etching condition of an n-type (100) silicon (Si) substrate under the illumination of an incandescent white light. As grown Si and PS through conventional direct current(DC) anodization were also included for comparison. The ACPEC formed porous Silicon (PS) with excellent structural and surface morphological characteristic. According to the field emission scanning electron microscope (FESEM) micrographs, the nanoporous structures exhibited pores with uniform circular structure with estimated sizes, ranging between 20.5 nm and 30.5 nm. The atomic force microscopy (AFM) revealed an increase in the surface roughness induced by porosification. As compared to the as-grown Si, PS by AC method exhibited a substantial visible photoluminescence (PL) intensity enhancement with blue-shift associated with the quantum confinement effect of the nanostructure Si. Thermally treated nickel (Ni) finger contact was deposited on the PS to form MSM photodetector. Ni/PS MSM photodetector showed lower dark and higher photocurrent compared to the as grown Si device.


2013 ◽  
Vol 2 (12) ◽  
pp. P117-P119 ◽  
Author(s):  
T. Yanagishita ◽  
M. Imaizumi ◽  
K. Nishio ◽  
H. Masuda

2008 ◽  
Vol 600-603 ◽  
pp. 871-874 ◽  
Author(s):  
J.H. Leach ◽  
Hadis Morkoç ◽  
Yue Ke ◽  
Robert P. Devaty ◽  
Wolfgang J. Choyke

Columnar porous Si-face 6H-SiC substrates were prepared by a photo-electrochemical etching method and applied as nanoimprint lithography (NIL) stamps. The diameter of the pores in the porous region was about 20 nm and the center-to-center separation between pores was about 60 nm. The columnar porous SiC substrates were subjected to a vapor phase silanization treatment whereby a monolayer of perfluorooctyltrichlorosilane (FOTS) was deposited in order to keep the stamps from sticking to the substrates during the imprint step. Subsequently, the porous SiC stamps were used to imprint polymethylmethacrylate (PMMA) at elevated temperatures and pressures. The imprinted PMMA could then be used to transfer the nanopattern on the columnar porous SiC to other substrates for various purposes; e.g. templates for GaN regrowth, catalysts for nanowire growth by vapor-liquid-solid type methods (VLS), etc. SiC is not typically used for NIL stamps since etch processing of SiC is less mature than that of Si. However, as demonstrated here, there is no reason why SiC cannot be used as a material for NIL stamps. The superior mechanical properties to Si make the use of SiC alluring as a master template for NIL processing.


1993 ◽  
Vol 298 ◽  
Author(s):  
Y. Kanemitsu ◽  
T. Matsumoto ◽  
T. Futagi ◽  
H. Mimura

AbstractWe have studied the origin of the visible photoluminescence (PL) from oxidized porous Si. The hydrogen–passivated surface of porous Si prepared by electrochemical etching is converted to stable silicon oxides by rapid–thermal–oxidization processes. At low oxidation temperature (Tox), the PL spectrum with a peak near 700 nm is observed. At high Tox above 800 °C, a strong blue PL is observed near 400 nm. We discuss the origin of blue and red PL by employing the results of ab initio electronic structure calculations of silicon–oxygen compounds.


1993 ◽  
Vol 297 ◽  
Author(s):  
T.J. Mc Mahon ◽  
Y. Xiao

We compare the electron spin resonance (ESR) signal of the dangling bond in porous silicon films, produced by electrochemical etching, to the ESR signal from hydrogenated amorphous Si (a-Si:H). The anisotropy of the ESR signal in porous Si showed g values varying as for the Pb Si/SiO2 interface dangling bond. The g value varies from g|| − 2.0020 to gL − 2.0080 with an inhomogeneously broadened line width increasing from 1.8 to 3.8 G. A porous Si ESR powder line, with superhyperfine and strain broadening intrinsic to porous Si, is compared to the a−Si:H dangling bond line. The result is more inhomogeneous broadening of line widths parallel and perpendicular to the dangling bond axis in a-Si:H, and less anisotropy in g|| − gL- No evidence was seen for light-induced metastability on a H-passivated porous Si film.


2020 ◽  
Vol 1535 ◽  
pp. 012006
Author(s):  
Ainorkhilah Mahmood ◽  
Zainuriah Hassan ◽  
Alhan Farhanah Abd Rahim ◽  
Rosfariza Radzali ◽  
Mahayatun Dayana Johan Ooi ◽  
...  
Keyword(s):  

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