3D modeling of electrostatic interaction between atomic force microscopy probe and dielectric surface: Impact of tip shape and cantilever contribution

IEEE Transactions on Dielectrics and Electrical Insulation ◽

10.1109/tdei.2016.005341 ◽

2016 ◽

Vol 23 (2) ◽

pp. 705-712 ◽

Author(s):

A. Boularas ◽

F. Baudoin ◽

G. Teyssedre ◽

C. Villeneuve-Faure ◽

S. Clain

Keyword(s):

Atomic Force Microscopy ◽

Electrostatic Interaction ◽

3D Modeling ◽

Dielectric Surface ◽

Atomic Force Microscopy Probe ◽

Force Microscopy ◽

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Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud

Journal of Applied Physics ◽

10.1063/1.5060655 ◽

2019 ◽

Vol 125 (4) ◽

pp. 045305 ◽

Author(s):

M. Azib ◽

F. Baudoin ◽

N. Binaud ◽

C. Villeneuve-Faure ◽

G. Teyssedre ◽

...

Keyword(s):

Sensitivity Analysis ◽

Atomic Force Microscopy ◽

Electrostatic Interaction ◽

Dielectric Film ◽

Atomic Force Microscopy Probe ◽

Force Microscopy ◽

Thin Dielectric Film ◽

Atomic Force ◽

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Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution

Journal of Physics D Applied Physics ◽

10.1088/1361-6463/aab286 ◽

2018 ◽

Vol 51 (16) ◽

pp. 165302 ◽

Author(s):

M Azib ◽

F Baudoin ◽

N Binaud ◽

C Villeneuve-Faure ◽

F Bugarin ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Analysis ◽

Numerical Simulations ◽

Electrostatic Interaction ◽

Potential Distribution ◽

Atomic Force Microscopy Probe ◽

Force Microscopy ◽

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Numerical calculation of nonlinear-optical interaction of gold nanoparticle and atomic force microscopy probe

2014 16th International Conference on Transparent Optical Networks (ICTON) ◽

10.1109/icton.2014.6876644 ◽

2014 ◽

Author(s):

Nikolay V. Ilin ◽

Dmitry A. Yashunin ◽

Andrey N. Stepanov ◽

Alexander I. Smirnov

Keyword(s):

Atomic Force Microscopy ◽

Numerical Calculation ◽

Gold Nanoparticle ◽

Nonlinear Optical ◽

Atomic Force Microscopy Probe ◽

Force Microscopy ◽

Atomic Force ◽

Optical Interaction

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Nanoscale localization of the near-surface nitrogen vacancy center assisted by a silicon atomic force microscopy probe

Journal of Physics Photonics ◽

10.1088/2515-7647/abcd86 ◽

2021 ◽

Vol 3 (1) ◽

pp. 014003

Author(s):

Xiangyu Ye ◽

Mengqi Wang ◽

Pengfei Wang ◽

Rui Li ◽

Maosen Guo ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Nitrogen Vacancy ◽

Atomic Force Microscopy Probe ◽

Near Surface ◽

Force Microscopy ◽

Atomic Force ◽

Nitrogen Vacancy Center ◽

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THEORETICAL ANALYSIS AND EXPERIMENTAL STUDY OF CARBON NANOTUBE PROBE AND CONVENTIONAL ATOMIC FORCE MICROSCOPY PROBE ON SURFACE ROUGHNESS

Chinese Journal of Mechanical Engineering ◽

10.3901/cjme.2008.05.062 ◽

2008 ◽

Vol 21 (05) ◽

pp. 62

Author(s):

Jinghe WANG

Keyword(s):

Experimental Study ◽

Surface Roughness ◽

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Theoretical Analysis ◽

Atomic Force Microscopy Probe ◽

Force Microscopy ◽

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Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

Journal of Applied Physics ◽

10.1063/1.2355432 ◽

2006 ◽

Vol 100 (7) ◽

pp. 074315 ◽

Author(s):

Osamu Takeuchi ◽

Takaaki Miyakoshi ◽

Atsushi Taninaka ◽

Katsunori Tanaka ◽

Daichi Cho ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Force Control ◽

Force Spectroscopy ◽

Dynamic Force ◽

Atomic Force Microscopy Probe ◽

Dynamic Force Spectroscopy ◽

Force Microscopy ◽

Spectroscopy Measurement ◽

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Variational treatment of electrostatic interaction force in atomic force microscopy

Zeitschrift für angewandte Mathematik und Physik ◽

10.1007/s00033-007-7041-7 ◽

2007 ◽

Vol 59 (4) ◽

pp. 702-714

Author(s):

E. Shmoylova ◽

A. Dorfmann ◽

S. Potapenko

Keyword(s):

Atomic Force Microscopy ◽

Electrostatic Interaction ◽

Interaction Force ◽

Force Microscopy ◽

Atomic Force ◽

Variational Treatment

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Fabrication of a Polymer-Metal Combined Atomic Force Microscopy Probe for Coarse Food Surface Imaging

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2013.7283 ◽

2013 ◽

Vol 13 (5) ◽

pp. 3550-3553

Author(s):

Hyen-Wook Kang ◽

Hiroshi Muramatsu ◽

Young-Soo Kwon

Keyword(s):

Atomic Force Microscopy ◽

Surface Imaging ◽

Atomic Force Microscopy Probe ◽

Force Microscopy ◽

Atomic Force ◽

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Electrostatic Interaction between Ionic Polymer Grafted Surfaces Studied by Atomic Force Microscopy

Journal of Colloid and Interface Science ◽

10.1006/jcis.1997.4784 ◽

1997 ◽

Vol 188 (2) ◽

pp. 431-438 ◽

Author(s):

Junfeng Zhang ◽

Emiko Uchida ◽

Yoshikimi Uyama ◽

Yoshito Ikada

Keyword(s):

Atomic Force Microscopy ◽

Electrostatic Interaction ◽

Ionic Polymer ◽

Force Microscopy ◽

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New optical near-field nanolithography with optical fiber probe laser irradiating atomic force microscopy probe tip

Integrated Ferroelectrics ◽

10.1080/10584587.2016.1165555 ◽

2016 ◽

Vol 169 (1) ◽

pp. 124-132 ◽

Author(s):

Jianlei Cui ◽

Lijun Yang ◽

Hui Xie ◽

Yang Wang ◽

Xuesong Mei ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Optical Fiber ◽

Probe Laser ◽

Atomic Force Microscopy Probe ◽

Fiber Probe ◽

Force Microscopy ◽

Optical Fiber Probe ◽

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