scholarly journals A high efficiency and low vibration liquid nitrogen cooling system for silicon crystal based x-ray optics

2020 ◽  
Vol 91 (10) ◽  
pp. 103105
Author(s):  
L. Lee ◽  
X. C. Cheng ◽  
L. Zhang
2013 ◽  
Vol 20 (4) ◽  
pp. 567-580 ◽  
Author(s):  
Lin Zhang ◽  
Manuel Sánchez del Río ◽  
Giulio Monaco ◽  
Carsten Detlefs ◽  
Thomas Roth ◽  
...  

X-ray crystal monochromators exposed to white-beam X-rays in third-generation synchrotron light sources are subject to thermal deformations that must be minimized using an adequate cooling system. A new approach was used to measure the crystal shape profile and slope of several cryogenically cooled (liquid nitrogen) silicon monochromators as a function of beam powerin situand under heat load. The method utilizes multiple angular scans across the Bragg peak (rocking curve) at various vertical positions of a narrow-gap slit downstream from the monochromator. When increasing the beam power, the surface of the liquid-nitrogen-cooled silicon crystal deforms from a concave shape at low heat load to a convex shape at high heat load, passing through an approximately flat shape at intermediate heat load. Finite-element analysis is used to calculate the crystal thermal deformations. The simulated crystal profiles and slopes are in excellent agreement with experiments. The parameters used in simulations, such as material properties, absorbed power distribution on the crystal and cooling boundary conditions, are described in detail as they are fundamental for obtaining accurate results.


2016 ◽  
Vol 41 (2) ◽  
pp. 281 ◽  
Author(s):  
Istvan Mohacsi ◽  
Ismo Vartiainen ◽  
Manuel Guizar-Sicairos ◽  
Petri Karvinen ◽  
Vitaliy A. Guzenko ◽  
...  

Author(s):  
S.H. Lau ◽  
Wenbing Yun ◽  
Sylvia JY Lewis ◽  
Benjamin Stripe ◽  
Janos Kirz ◽  
...  

Abstract We describe a technique for mapping the distribution and concentrations of trace elements, most notably with capabilities of achieving 1-10 parts per million sensitivities within 1 second and at <8 μm resolution. The technique features an innovative, high flux microstructured x-ray source and a new approach to x-ray optics comprising a high efficiency twin paraboloidal x-ray mirror lens. The resulting ability to acquire dramatically higher sensitivities and resolution than conventional x-ray fluorescence approaches, and at substantially higher throughput enables powerful compositional mapping for failure analysis, process development, and process monitoring.


2021 ◽  
Vol 13 (10) ◽  
pp. 442-448
Author(s):  
Vladimir Zarubin ◽  
Sergey Zarubin ◽  
Vladimir Zimin ◽  
Yakov Osadchy

2014 ◽  
Vol 21 (3) ◽  
pp. 507-517 ◽  
Author(s):  
Lin Zhang ◽  
Raymond Barrett ◽  
Peter Cloetens ◽  
Carsten Detlefs ◽  
Manuel Sanchez del Rio

The crystal lattice of single-crystal silicon gives rise to anisotropic elasticity. The stiffness and compliance coefficient matrix depend on crystal orientation and, consequently, Young's modulus, the shear modulus and Poisson's ratio as well. Computer codes (in Matlab and Python) have been developed to calculate these anisotropic elasticity parameters for a silicon crystal in any orientation. These codes facilitate the evaluation of these anisotropy effects in silicon for applications such as microelectronics, microelectromechanical systems and X-ray optics. For mechanically bent X-ray optics, it is shown that the silicon crystal orientation is an important factor which may significantly influence the optics design and manufacturing phase. Choosing the appropriate crystal orientation can both lead to improved performance whilst lowering mechanical bending stresses. The thermal deformation of the crystal depends on Poisson's ratio. For an isotropic constant Poisson's ratio, ν, the thermal deformation (RMS slope) is proportional to (1 + ν). For a cubic anisotropic material, the thermal deformation of the X-ray optics can be approximately simulated by using the average of ν12and ν13as an effective isotropic Poisson's ratio, where the direction 1 is normal to the optic surface, and the directions 2 and 3 are two normal orthogonal directions parallel to the optical surface. This average is independent of the direction in the optical surface (the crystal plane) for Si(100), Si(110) and Si(111). Using the effective isotropic Poisson's ratio for these orientations leads to an error in thermal deformation smaller than 5.5%.


2012 ◽  
Author(s):  
H. Cease ◽  
D. DePoy ◽  
G. Derylo ◽  
H. T. Diehl ◽  
J. Estrada ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document