Multiscale measurements with adjustable x-ray spot size for in situ imaging and diffraction

2021 ◽  
Vol 92 (3) ◽  
pp. 033108
Author(s):  
S. Y. Li ◽  
Y. Y. Zhang ◽  
N. B. Zhang ◽  
H. L. Xie ◽  
D. Fan ◽  
...  
Keyword(s):  
X Ray ◽  
2022 ◽  
Vol 93 (1) ◽  
pp. 013703
Author(s):  
Guang Yang ◽  
Halil Tetik ◽  
Johanna Nelson Weker ◽  
Xianghui Xiao ◽  
Shuting Lei ◽  
...  

2011 ◽  
Vol 110 (10) ◽  
pp. 102211 ◽  
Author(s):  
P. Fenter ◽  
S. S. Lee ◽  
Z. Zhang ◽  
N. C. Sturchio

2011 ◽  
Vol 18 (6) ◽  
pp. 879-884 ◽  
Author(s):  
Takayuki Muro ◽  
Yukako Kato ◽  
Tomohiro Matsushita ◽  
Toyohiko Kinoshita ◽  
Yoshio Watanabe ◽  
...  

A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleavedin situwith a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ–Xdirection reflecting the bulk electronic states were observed with a photon energy of 879 eV.


2018 ◽  
Vol 24 (S1) ◽  
pp. 1002-1003
Author(s):  
Brian M. Patterson ◽  
Nikolaus L. Cordes ◽  
Kevin Henderson ◽  
Xianghui Xiao ◽  
Nikhilesh Chawla
Keyword(s):  
X Ray ◽  

1996 ◽  
Vol 464 ◽  
Author(s):  
Youli Li ◽  
Stefan H.J. Idziak ◽  
Ernie Caine ◽  
G. Subramanian ◽  
Evelyn Hu ◽  
...  

ABSTRACTWe present results of simultaneous efforts to develop: 1.) Bragg-Fresnel Optics(BFO) to be used in X-ray microdiffraction methods, in particular as applied to structural studies of complex fluids and biomaterials under confinement and flow conditions; and 2.) Methodologies for confining complex fluids and biomaterials for in-situ structural studies. Using microelectronics process technology, we have fabricated linear and circular Bragg-Fresnel Lenses (BFL) in Si and III-V compound semiconductor substrates such as InP, GaAs and GaAs heterostructures with outermost zone width to 0.25 μm. X-ray characterization of linear BFLs were performed on a wiggler beamline at Stanford Synchrotron Radiation Laboratory (SSRL) at x-ray energies of 8 keV and 16 keV. A ∼5 μm focal spot size was obtained with a 50 μm incident beam, which was determined by the partial coherence of the source. On the confinement techniques, we have developed the X-ray Surface Force Apparatus (XSFA) which allows in-situ x-ray diffraction measurements to be made on fluid thin films confined between two atomically smooth surfaces. A new approach is being pursued to study the effects of confinement and flow on complex fluids and biological materials using microchannels fabricated on glass substrates.


ACS Nano ◽  
2020 ◽  
Vol 14 (11) ◽  
pp. 15973-15982
Author(s):  
Lucas A. B. Marçal ◽  
Eitan Oksenberg ◽  
Dmitry Dzhigaev ◽  
Susanna Hammarberg ◽  
Amnon Rothman ◽  
...  

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