High-temperature recrystallization effects in swift heavy ion irradiated KY(WO4)2

2021 ◽  
Vol 130 (18) ◽  
pp. 185109
Author(s):  
R. N. Frentrop ◽  
V. Tormo-Marquez ◽  
F. B. Segerink ◽  
M. C. Pujol ◽  
J. Olivares ◽  
...  
2016 ◽  
Vol 13 (10-12) ◽  
pp. 927-931
Author(s):  
V. A. Skuratov ◽  
A. S. Sohatsky ◽  
J. H. O'Connell ◽  
K. Kornieieva ◽  
A. A. Nikitina ◽  
...  

2001 ◽  
Vol 705 ◽  
Author(s):  
Alexander S. Berdinsky ◽  
Dietmar Fink ◽  
Alexander V. Petrov ◽  
Manfred Müller ◽  
Lewis T. Chadderton ◽  
...  

AbstractFullerite nanotubules of 100 nm to 2 μm radius, up to 200 nm wal thickness and 10 μm length were produced inside etched swift heavy ion tracks in a polymer, by letting fullerence precipitate from a concentrated C60 solution within the tracks. After contacting the tubules on both sides with silver paste, their resistivity was measured as a function of temperature. All of the 13 prepared samples show a complex behaviour that can be described by tw Arrhenius curves, the low temperature branch with activation energy Eact = (1.77 ± 0.2) eV stemming from pure C60, and the high temperature branch being tentatively ascribed to C60Agx with x ≍ 12.4 and Eact = (0.68 ± 0.2) eV, as the letter compound has found to be produced at ambient temperature by C60 / Ag thermal intermixture. Such samples with tw branches of negative temperature coefficients of resistance might be useful to construct advanced thermoresistors.


RSC Advances ◽  
2021 ◽  
Vol 11 (42) ◽  
pp. 26218-26227
Author(s):  
R. Panda ◽  
S. A. Khan ◽  
U. P. Singh ◽  
R. Naik ◽  
N. C. Mishra

Swift heavy ion (SHI) irradiation in thin films significantly modifies the structure and related properties in a controlled manner.


Author(s):  
Eric O'Quinn ◽  
Cameron Tracy ◽  
William F. Cureton ◽  
Ritesh Sachan ◽  
Joerg C. Neuefeind ◽  
...  

Er2Sn2O7 pyrochlore was irradiated with swift heavy Au ions (2.2 GeV), and the induced structural modifications were systematically examined using complementary characterization techniques including transmission electron microscopy (TEM), X-ray diffraction...


2021 ◽  
Vol 129 (3) ◽  
pp. 035108
Author(s):  
Harsh Gupta ◽  
Ravi K. Bommali ◽  
Santanu Ghosh ◽  
Himanshu Srivastava ◽  
Arvind Srivastava ◽  
...  

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