Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging

Author(s):  
J. Ahmed ◽  
S. G. Roberts ◽  
A. J. Wilkinson
2007 ◽  
Vol 26-28 ◽  
pp. 1317-1320
Author(s):  
Yoshihisa Kaneko ◽  
M. Ishikawa ◽  
Satoshi Hashimoto

A fatigue crack growth test was conducted in a polycrystalline copper. Dislocation structure formed near an intergranular fatigue crack was investigated by electron channelling contrast imaging (ECCI) method. The ECCI method enables us to observe dislocations lying under surface using a scanning electron microscope. The fatigue crack in the copper specimen was grown along both grain boundaries and slip bands inside grain. The ECCI observations revealed that both the vein dislocation structure and the cell structures were formed near the grain boundaries. The formations of different dislocation structures near boundaries could be interpreted in terms of the plastic strain incompatibility.


Author(s):  
J.T. Czernuszka ◽  
N.J. Long ◽  
P.B. Hirsch

In the 1970s there was considerable interest in the development of the electron channelling contrast imaging (ECCI) technique for imaging near surface defects in bulk (electron opaque) specimens. The predictions of the theories were realised experimentally by Morin et al., who used a field emission gun (FEG) operating at 40-50kV and an energy filter such that only electrons which had lost no more than a few 100V were detected. This paper presents the results of a set of preliminary experiments which show that an energy filter system is unneccessary to image and characterise the Burgers vectors of dislocations in bulk specimens. The examples in the paper indicatethe general versatility of the technique.A VG HB501 STEM with a FEG was operated at 100kV. A single tilt cartridge was used in the reflection position of the microscope. A retractable back-scattered electron detector was fitted into the secondary electron port and positioned to within a few millimetres of the specimen. The image was acquired using a Synoptics Synergy framestore and digital scan generator and subsequently processed using Semper 6. The beam divergence with the specimen in this position was 2.5 mrads with a spot size of approximately 4nm. Electron channelling patterns were used to orientate the sample.


2006 ◽  
Vol 39 (10) ◽  
pp. 3588-3597 ◽  
Author(s):  
Shigeyuki Toki ◽  
Igors Sics ◽  
Chris Burger ◽  
Dufei Fang ◽  
Lizhi Liu ◽  
...  

2019 ◽  
Vol 162 ◽  
pp. 103-107 ◽  
Author(s):  
G. L'hôte ◽  
C. Lafond ◽  
P. Steyer ◽  
S. Deschanel ◽  
T. Douillard ◽  
...  

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