EFFECT OF LONGITUDE-DEPENDENT CLOUD COVERAGE ON EXOPLANET VISIBLE WAVELENGTH REFLECTED-LIGHT PHASE CURVES

Traveling light is totally reflected on boundary, the evanescent wave intensity exhibits exponential decay with distance from the boundary at which the wave was formed. In this paper, we do theoretical analysis of the total reflected light phase shift and power value of the evanescent wave was “disturbed” by the other objects. A marvelous optics phenomenon is the -π/2 phase shift of reflected light.

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Reflected Light Phase Curves in the TESS Era

The Astronomical Journal ◽

10.3847/1538-3881/ab29fa ◽

2019 ◽

Vol 158 (2) ◽

pp. 66 ◽

Cited By ~ 4

Author(s):

L. C. Mayorga ◽

Natasha E. Batalha ◽

Nikole K. Lewis ◽

Mark S. Marley

Keyword(s):

Light Phase ◽

Reflected Light

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Daily Analytical Problem Solving in Criminalistics with Rapid and Reliable Advanced Instrumentation - the Microscope

Microscopy and Microanalysis ◽

10.1017/s1431927600028415 ◽

2001 ◽

Vol 7 (S2) ◽

pp. 468-469

Author(s):

W. Moorehead

Keyword(s):

Dna Analysis ◽

Drug Analysis ◽

Electromagnetic Spectrum ◽

Light Phase ◽

Analytical Scheme ◽

Scientific Disciplines ◽

Reflected Light ◽

Fusion Methods ◽

Scene Investigation ◽

Engineering Psychology

Forensic science incorporates many different scientific disciplines: criminalistics, toxicology, pathology, entomology, engineering, psychology, accounting, etc. Criminalistics incorporates such diverse areas as crime scene investigation, sexual assault evidence, DNA analysis, firearms identification and comparison, drug analysis, impression evidence, and trace evidence.A variety of microscopes and microscopical techniques are used to answer “real world” questions about physical evidence in criminalistics. The microscopes most often used include stereo (dissecting), biological (brightfield), polarizing light, phase contrast, fluorescence, transmitted light comparison, reflected light comparison, and scanning electron. Additionally, detectors from different areas of the electromagnetic spectrum have been added to microscopes to enhance the information obtained from a specimen: infrared, visible-ultraviolet, and x-ray. to gather more information about the specimen with visible light microscopes, dispersion staining(1), contrast enhancement techniques(2) fusion methods(3), chemical staining(4), and micro-chemical tests(5,6) can be integrated into the analytical scheme.

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Closed-form ab initio solutions of geometric albedos and reflected light phase curves of exoplanets

Nature Astronomy ◽

10.1038/s41550-021-01444-7 ◽

2021 ◽

Vol 5 (10) ◽

pp. 1001-1008

Author(s):

Kevin Heng ◽

Brett M. Morris ◽

Daniel Kitzmann

Keyword(s):

Ab Initio ◽

Closed Form ◽

Light Phase ◽

Reflected Light

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Confocal laser microscopy of impregnated central nervous system tissue

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100102559 ◽

1988 ◽

Vol 46 ◽

pp. 94-95

Author(s):

J.N. Turner ◽

M. Siemens ◽

D. Szarowski ◽

D.N. Collins

Keyword(s):

Electron Microscopy ◽

Central Nervous System ◽

Nervous System ◽

Three Dimensional ◽

Dimensional Structure ◽

Confocal Laser ◽

High Contrast ◽

Central Nervous System Tissue ◽

Tissue Samples ◽

Reflected Light

A classic preparation of central nervous system tissue (CNS) is the Golgi procedure popularized by Cajal. The method is partially specific as only a few cells are impregnated with silver chromate usualy after osmium post fixation. Samples are observable by light (LM) or electron microscopy (EM). However, the impregnation is often so dense that structures are masked in EM, and the osmium background may be undesirable in LM. Gold toning is used for a subtle but high contrast EM preparation, and osmium can be omitted for LM. We are investigating these preparations as part of a study to develop correlative LM and EM (particularly HVEM) methodologies in neurobiology. Confocal light microscopy is particularly useful as the impregnated cells have extensive three-dimensional structure in tissue samples from one to several hundred micrometers thick. Boyde has observed similar preparations in the tandem scanning reflected light microscope (TSRLM).

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Some early history of replica techniques for electron microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130018 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1076-1077

Author(s):

Robert M. Fisher

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Optical Microscope ◽

Early History ◽

Bulk Materials ◽

Thin Sections ◽

Transmission Electron ◽

Reflected Light ◽

History Of ◽

Electron Microscopes

By 1940, a half dozen or so commercial or home-built transmission electron microscopes were in use for studies of the ultrastructure of matter. These operated at 30-60 kV and most pioneering microscopists were preoccupied with their search for electron transparent substrates to support dispersions of particulates or bacteria for TEM examination and did not contemplate studies of bulk materials. Metallurgist H. Mahl and other physical scientists, accustomed to examining etched, deformed or machined specimens by reflected light in the optical microscope, were also highly motivated to capitalize on the superior resolution of the electron microscope. Mahl originated several methods of preparing thin oxide or lacquer impressions of surfaces that were transparent in his 50 kV TEM. The utility of replication was recognized immediately and many variations on the theme, including two-step negative-positive replicas, soon appeared. Intense development of replica techniques slowed after 1955 but important advances still occur. The availability of 100 kV instruments, advent of thin film methods for metals and ceramics and microtoming of thin sections for biological specimens largely eliminated any need to resort to replicas.

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Tandem scanning reflected light microscopy: How it works and applications

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100142104 ◽

1986 ◽

Vol 44 ◽

pp. 84-87

Author(s):

Alan Boyde ◽

Milan Hadravský ◽

Mojmír Petran ◽

Timothy F. Watson ◽

Sheila J. Jones ◽

...

Keyword(s):

Light Microscopy ◽

Focal Plane ◽

Central Symmetry ◽

Single Line ◽

Scanning Microscope ◽

Reflected Light ◽

Illuminating Light ◽

Illuminating Beam

The principles of tandem scanning reflected light microscopy and the design of recent instruments are fully described elsewhere and here only briefly. The illuminating light is intercepted by a rotating aperture disc which lies in the intermediate focal plane of a standard LM objective. This device provides an array of separate scanning beams which light up corresponding patches in the plane of focus more intensely than out of focus layers. Reflected light from these patches is imaged on to a matching array of apertures on the opposite side of the same aperture disc and which are scanning in the focal plane of the eyepiece. An arrangement of mirrors converts the central symmetry of the disc into congruency, so that the array of apertures which chop the illuminating beam is identical with the array on the observation side. Thus both illumination and “detection” are scanned in tandem, giving rise to the name Tandem Scanning Microscope (TSM). The apertures are arranged on Archimedean spirals: each opposed pair scans a single line in the image.

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Modelling Light Transmission in a Fiber-Optical Reflection System

Nonlinear Analysis Modelling and Control ◽

10.15388/na.2004.9.1.15170 ◽

2004 ◽

Vol 9 (1) ◽

pp. 55-63

Author(s):

V. Kleiza

Keyword(s):

Optical Sensors ◽

Light Transmission ◽

External Cavity ◽

Linear Displacement ◽

Fiber System ◽

Light Emitting ◽

Optical Media ◽

Reflected Light ◽

Fiber Optical ◽

Fiber Optical Sensors

Light transmission in the reflection fiber system, located in external optical media, has been investigated for application as sensors. The system was simulated by different models, including external cavity parameters such as the distance between light emitting and receiving fibers and mirror positioning distance. The sensitivity to a linear displacement of the sensors was studied as a function of the distance between the tips of the light emitting fiber and the center of the pair reflected light collecting fibers, by positioning a mirror. Physical fundamentals and operating principles of the advanced fiber optical sensors were revealed.

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