Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials

2011 ◽  
Vol T145 ◽  
pp. 014043
Author(s):  
S Milc ◽  
A Kruk ◽  
G Cempura ◽  
H J Penkalla ◽  
C Thomser ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Microstructure Characterization ◽  
Transmission Electron ◽  
Focused Ion Beam Tomography

scholarly journals Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy

2009 ◽  
Vol 15 (S2) ◽  
pp. 368-369 ◽  
Author(s):  
S Duarte ◽  
A Avishai ◽  
A Sadan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Bonded Interface ◽  
Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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