Microstructural Characterization of Ti-6Al-4V Metal Chips by Focused Ion Beam and Transmission Electron Microscopy

Focused Ion Beam ◽

Ion Beam ◽

Microstructural Characterization ◽

Transmission Electron ◽

Metal Chips

Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy

10.1017/s1431927609098031 ◽

2009 ◽

Vol 15 (S2) ◽

pp. 368-369 ◽

Cited By ~ 1

Author(s):

S Duarte ◽

A Avishai ◽

A Sadan

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Focused Ion Beam ◽

Ion Beam ◽

Bonded Interface ◽

Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Characterization of the Surface Properties of Commercially Available Dental Implants Using Scanning Electron Microscopy, Focused Ion Beam, and High-Resolution Transmission Electron Microscopy

Clinical Implant Dentistry and Related Research ◽

10.1111/j.1708-8208.2007.00056.x ◽

2008 ◽

Vol 10 (1) ◽

pp. 11-22 ◽

Cited By ~ 59

Author(s):

Tobias Jarmar ◽

Anders Palmquist ◽

Rickard Brånemark ◽

Leif Hermansson ◽

Håkån Engqvist ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

High Resolution ◽

Surface Properties ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Scanning Electron

Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials

Physica Scripta ◽

10.1088/0031-8949/2011/t145/014043 ◽

2011 ◽

Vol T145 ◽

pp. 014043

Author(s):

S Milc ◽

A Kruk ◽

G Cempura ◽

H J Penkalla ◽

C Thomser ◽

...

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Microstructure Characterization ◽

Transmission Electron ◽

Focused Ion Beam Tomography

Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy

10.1017/s1431927602103795 ◽

2002 ◽

Vol 8 (S02) ◽

pp. 1144-1145 ◽

Cited By ~ 2

Author(s):

C. R. Perrey ◽

C. B. Carter ◽

P. G. Kotula ◽

J. R. Michael

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Nanoparticle Films ◽

Transmission Electron ◽

Focused Ion Beam Milling

Characterization of graphite implanted with chlorine ions using combined Raman microspectrometry and transmission electron microscopy on thin sections prepared by focused ion beam

Carbon ◽

10.1016/j.carbon.2009.11.049 ◽

2010 ◽

Vol 48 (4) ◽

pp. 1244-1251 ◽

Cited By ~ 30

Author(s):

M.R. Ammar ◽

J.N. Rouzaud ◽

C.E. Vaudey ◽

N. Toulhoat ◽

N. Moncoffre

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Thin Sections ◽

Transmission Electron ◽

Chlorine Ions ◽

Raman Microspectrometry

Transmission Electron Microscopy Characterization of High-Temperatur Oxidation of Fe-20Cr-5Al Alloy Prepared by Focused Ion Beam Technique

Makara Journal of Technology ◽

10.7454/mst.v19i2.3038 ◽

2015 ◽

Vol 19 (2) ◽

pp. 85

Author(s):

Mohammad Dani ◽

Pudji Untoro ◽

Teguh Yulius Surya Panca Putra ◽

Parikin Parikin ◽

Joachim Mayer ◽

...

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Beam Technique

Transmission Electron Microscopy Characterization of High-Temperatur Oxidation of Fe-20Cr-5Al Alloy Prepared by Focused Ion Beam Technique

Makara Journal of Technology ◽

10.7454/mst.v19i2.3141 ◽

2015 ◽

Vol 19 (2) ◽

pp. 85

Author(s):

Mohammad Dani ◽

Pudji Untoro ◽

Teguh Yulius Surya Panca Putra ◽

Parikin Parikin ◽

Joachim Mayer ◽

...

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Transmission Electron Microscopy Characterization ◽

Microscopy Characterization ◽

Beam Technique

Characterization of Epitaxial Layer Defects in Silicon Wafers Using Focused Ion Beam and Transmission Electron Microscopy

10.1017/s1431927605509000 ◽

2005 ◽

Vol 11 (S02) ◽

Author(s):

J–H Cho ◽

D–H Cho ◽

C–W Lee ◽

W–Y Kim ◽

S–H Lim

Keyword(s):

Electron Microscopy ◽

Epitaxial Layer ◽

Focused Ion Beam ◽

Ion Beam ◽

Silicon Wafers ◽

Transmission Electron

Characterization of heterogeneity in microstructure of NBG-18 nuclear graphite by correlative analysis of optical texture and focused ion beam transmission electron microscopy

Carbon ◽

10.1016/j.carbon.2021.12.035 ◽

2021 ◽

Author(s):

Ke Shen ◽

Xue Zhang ◽

Suyuan Yu ◽

Feiyu Kang

Keyword(s):

Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Optical Texture ◽

Correlative Analysis ◽

Nuclear Graphite ◽

Transmission Electron ◽

Beam Transmission

Characterization of Oxide Layers on Stainless Steel Using Auger Electron Spectroscopy (AES), Scanning Electron Microscopy-Focused Ion Beam (SEM-FIB) and Transmission Electron Microscopy (TEM)

10.1017/s1431927620018541 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1566-1566

Author(s):

Henry Ajo

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron ◽

Scanning Electron