Characterization of the Surface Properties of Commercially Available Dental Implants Using Scanning Electron Microscopy, Focused Ion Beam, and High-Resolution Transmission Electron Microscopy
2008 ◽
Vol 10
(1)
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pp. 11-22
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2009 ◽
Vol 15
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pp. 368-369
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2010 ◽
Vol 62
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pp. 399-402
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1993 ◽
Vol 66
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pp. 2419-2421
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2012 ◽
Vol 174-177
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pp. 508-511
2009 ◽
Vol 165
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pp. 97-106
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2009 ◽
Vol 124
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pp. 239-250
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