A Spectroscopic Ellipsometry Study of TiO
2
Thin Films Prepared by dc Reactive Magnetron Sputtering: Annealing Temperature Effect
2007 ◽
Vol 24
(6)
◽
pp. 1505-1508
◽
2012 ◽
Vol 17
(4)
◽
pp. 309-314
◽
Structure and Electrical Property of CuInS2 Thin Films Deposited by DC Reactive Magnetron Sputtering
2011 ◽
Vol 26
(12)
◽
pp. 1287-1292
◽
2011 ◽
Vol 21
(4)
◽
pp. 770-776
◽
2010 ◽
Vol 45
(18)
◽
pp. 4994-5001
◽
2011 ◽
Vol 13
(2)
◽
pp. 314-320
◽