Deposition of high quality amorphous silicon films with strong hydrogen diluted silane as reactant gas source

1993 ◽  
Vol 2 (11) ◽  
pp. 807-815 ◽  
Author(s):  
He Yu-liang ◽  
Liu Xiang-na ◽  
Yin Cheng-zhong ◽  
Zhang Yu
1988 ◽  
Vol 64 (6) ◽  
pp. 3215-3223 ◽  
Author(s):  
J. Doyle ◽  
R. Robertson ◽  
G. H. Lin ◽  
M. Z. He ◽  
A. Gallagher

1988 ◽  
Vol 27 (Part 2, No. 6) ◽  
pp. L948-L950 ◽  
Author(s):  
Woo Yeol Kim ◽  
Makoto Konagai ◽  
Kiyoshi Takahashi

1990 ◽  
Vol 57 (5) ◽  
pp. 484-486 ◽  
Author(s):  
Akira Yoshida ◽  
Katsushi Inoue ◽  
Haruhiko Ohashi ◽  
Yoji Saito

1994 ◽  
Vol 64 (14) ◽  
pp. 1862-1864 ◽  
Author(s):  
Vikram L. Dalal ◽  
E. X. Ping ◽  
Sanjeev Kaushal ◽  
Mohan K. Bhan ◽  
Mark Leonard

Vacuum ◽  
2003 ◽  
Vol 70 (2-3) ◽  
pp. 81-85
Author(s):  
Bohdan Jaroszewicz ◽  
Tadeusz Budzyński ◽  
Andrzej Panas ◽  
Andrzej Kociubinski ◽  
Wojciech Słysz ◽  
...  

1981 ◽  
Vol 42 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
F. J. Demond ◽  
G. Müller ◽  
H. Damjantschitsch ◽  
H. Mannsperger ◽  
S. Kalbitzer ◽  
...  

2003 ◽  
Vol 762 ◽  
Author(s):  
Guofu Hou ◽  
Xinhua Geng ◽  
Xiaodan Zhang ◽  
Ying Zhao ◽  
Junming Xue ◽  
...  

AbstractHigh rate deposition of high quality and stable hydrogenated amorphous silicon (a-Si:H) films were performed near the threshold of amorphous to microcrystalline phase transition using a very high frequency plasma enhanced chemical vapor deposition (VHF-PECVD) method. The effect of hydrogen dilution on optic-electronic and structural properties of these films was investigated by Fourier-transform infrared (FTIR) spectroscopy, Raman scattering and constant photocurrent method (CPM). Experiment showed that although the phase transition was much influenced by hydrogen dilution, it also strongly depended on substrate temperature, working pressure and plasma power. With optimized condition high quality and high stable a-Si:H films, which exhibit σph/σd of 4.4×106 and deposition rate of 28.8Å/s, have been obtained.


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