Effects of quantum-well indium content on deep defects and reliability of InGaN/GaN light-emitting diodes with under layer
2002 ◽
Keyword(s):
2003 ◽
Vol 42
(Part 1, No. 4B)
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pp. 2281-2283
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Keyword(s):
Keyword(s):
2003 ◽
Vol 42
(Part 2, No. 3A)
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pp. L226-L228
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Keyword(s):
2003 ◽
Vol 0
(7)
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pp. 2257-2260
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Keyword(s):
Keyword(s):
2010 ◽
Vol 43
(35)
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pp. 354004
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Keyword(s):
2009 ◽
Vol 21
(7)
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pp. 414-416
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