Effects of Si/SiO2interface stress on the performance of ultra-thin-body field effect transistors: a first-principles study
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2018 ◽
Vol 98
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pp. 60-65
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2021 ◽
Vol 10
(9)
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pp. 091016
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2016 ◽
Vol 5
(4)
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pp. P3202-P3205
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