Deep level defects and their instability in PLD-grown IGZO (In2Ga2Zn5O11) thin films studied by thermally stimulated current spectroscopy
2021 ◽
Vol 0
(1)
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pp. 75-80
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2006 ◽
pp. 509-512
2010 ◽
Vol 43
(34)
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pp. 345104
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1998 ◽
Vol 27
(2)
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pp. 62-68
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1996 ◽
Vol 35
(Part 1, No. 5A)
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pp. 2599-2604
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